Synopsys, Inc.

Wenyuan Wang

Yansheng Luo

Peivand Fallah-Tehrani

Jindrich Zejda

William Chiu-Ting Shu

Mahmoud Shahram

Seyed Alireza Kasnavi

Alexander Gyure

Chi-Chong Lo

One embodiment of the invention provides a system that analyzes the propagation of noise through an integrated circuit. During operation, the system obtains an input noise signal to be applied to a cell within the integrated circuit. The system then looks up parameters specifying how noise affects the cell, and then uses the parameters to determine how the input noise signal affects the cell. This can involve determining if the input noise signal will cause the cell to fail and/or determining a propagated noise signal that emanates from the cell.

Method and apparatus for detecting and analyzing the propagation of noise through an integrated circuit

One embodiment of the invention provides a system that characterizes cells within an integrated circuit. During operation, the system obtains a number of input noise signals to be applied to the cell. The system then simulates responses of the cell to each of the input noise signals, and stores a representation of the responses. This allows a subsequent analysis operation to access the stored representation to determine a response of the cell instead of having to perform a time-consuming simulation operation.

Method and apparatus for characterizing the propagation of noise through a cell in an integrated circuit

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Fremont, CA, United States of America

Wenyuan Wang