Apple Inc.

Wenda Wang

Nitish Srivastava

Cuneyt Oncel Tuzel

Ricardo Da Silveira Cabral

Shreyas Saxena

Dimitrios Kottas

Guanhang Wu

Luciano Spinello

A method includes obtaining training samples that include images that depict objects and annotations of annotated key point locations for the objects. The method also includes training a machine learning model to determine estimated key point locations for the objects and key point uncertainty values for the estimated key point locations by minimizing a loss function that is based in part on a key point localization loss value that represents a difference between the annotated key point locations and the estimated key point locations values and is weighted by the key point uncertainty values.

Key point recognition with uncertainty measurement

Growing community of inventors

Mountain View, CA, United States of America

Wenda Wang