Test Research, Inc.

Wen-Tzong Lee

Kuang-Pu Wen

Don Lin

An apparatus for three-dimensional inspection includes a carrier, an image sensing component, and a processor. The carrier is configured to hold an object. The image sensing component is configured to capture a first image, a second image and a third image of the object along a first axis, a second axis, and a third axis respectively, and the first axis, the second axis, and the third axis are not parallel with each other. The processor is configured to analyze the first image and the second image to obtain a first directional stereo information, and analyze the third image and a determined image of the object to obtain a second directional stereo information.

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Pingtung, Taiwan

Wen-Tzong Lee