Taiwan Semiconductor Manufacturing Comp. Ltd.

Wen-Szu Chung

Wei-Kay Chiu

A test apparatus and method for testing integrated circuit modules permitting visual observation of both top and bottom of the module under test. The test apparatus uses a first circuit board and a second circuit board interconnected by means of cables between cable sockets attached to each circuit board. The first circuit board has a display opening. An integrated circuit socket having a center opening is attached to the first circuit board so that the center opening of the integrated circuit socket is directly over the display opening of the first circuit board. Input connectors and jumper sockets attached to the second circuit board permit electrical signals to be connected to the integrated circuit socket contacts. Integrated circuit modules inserted into the integrated circuit socket can be visually observed directly or through the display opening in the first circuit board.

Growing community of inventors

Hsinchu, Taiwan

Wen-Szu Chung