Via Technologies, Inc.

Wen-Lung Hsu

Chia-Chin Chu

A method of analyzing a sample waveform in the time domain. Firstly, a periodic wave, such as a sinusoidal wave, is inputted into a waveform processing module for obtaining a sample waveform. Next, a detection of a number of peaks of the sample waveform is performed. A determination is then made as to whether the period of the sample waveform is obtainable from the peaks of the sample waveform. If not obtainable, it indicates the waveform processing module is malfunctioning. If obtainable, a determination is then made as to whether the period of the sample waveform is equal to the predicted period. According to this determination, it indicates whether the waveform processing module is functioning.

Method for analyzing a sample waveform in the time domain

An apparatus for testing a main board processing circuit for joystick buttons. The apparatus is used for testing the processing circuit of a main board, wherein the processing circuit is coupled to the joystick through a connector. The apparatus contains a test tool and a short-circuit node, wherein the test tool contains M pins, corresponding to M pins of the connector, for coupling the test tool with the connector. N pins of the M pins of the test tool correspond to the N pins of the connector, which are connected to the buttons. The short-circuit node is the common node of the N pins that are all short-circuited for simulating the actions of the joystick buttons. In the test, the connector is firstly connected to the test tool and the status values stored in a status register are detected. The connection is then disconnected from the test tool.

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Taipei, Taiwan

Wen-Lung Hsu