Growing community of inventors

Taipei Hsien, Taiwan

Wen-Laing Tseng

Average Co-Inventor Count = 4.75

ph-index = 1

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 3

Wen-Laing TsengShou-Kuo Hsu (11 patents)Wen-Laing TsengShen-Chun Li (11 patents)Wen-Laing TsengYu-Chang Pai (6 patents)Wen-Laing TsengHsien-Chuan Liang (5 patents)Wen-Laing TsengCheng-Hsien Lee (4 patents)Wen-Laing TsengYung-Chieh Chen (3 patents)Wen-Laing TsengChun-Jen Chen (1 patent)Wen-Laing TsengChia-Nan Pai (1 patent)Wen-Laing TsengChun-Neng Liao (1 patent)Wen-Laing TsengWen-Laing Tseng (11 patents)Shou-Kuo HsuShou-Kuo Hsu (155 patents)Shen-Chun LiShen-Chun Li (63 patents)Yu-Chang PaiYu-Chang Pai (37 patents)Hsien-Chuan LiangHsien-Chuan Liang (52 patents)Cheng-Hsien LeeCheng-Hsien Lee (24 patents)Yung-Chieh ChenYung-Chieh Chen (37 patents)Chun-Jen ChenChun-Jen Chen (29 patents)Chia-Nan PaiChia-Nan Pai (23 patents)Chun-Neng LiaoChun-Neng Liao (7 patents)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Hon Hai Precision Industry Co., Ltd. (11 from 19,763 patents)


11 patents:

1. 8838272 - Robotic arm control system and method

2. 8798968 - Computing device and method for enforcing passivity of scattering parameter equivalent circuit

3. 8781783 - System and method for checking ground vias of a controller chip of a printed circuit board

4. 8768993 - Direct current compensation system and method for scattering parameter rational functions

5. 8744795 - Electronic device and method for controlling modulations of multiple-instruments and sensors

6. 8626482 - Equivalent circuit simulation system and method

7. 8513968 - Manipulator of robot

8. 8494820 - Computing device and method for analyzing scattering parameters passivity

9. 8489379 - Equivalent circuit simulation system and method for HSPICE

10. 8383957 - Printed circuit board

11. 8301405 - System and method for measuring pin voltages of electronic components

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as of
12/4/2025
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