Omnivision Technologies, Inc.

Wen He

Yan Li

Liang Zuo

Satoshi Sakurai

Zhenfu Tian

A failure detection circuit for an image sensor includes a first input node, an array of second input nodes, and an output stage. The first input node is coupled to a reference voltage. The array of second input nodes has each input node coupled to receive a signal from a bitline of a bitline array in an image sensor that includes an array of pixels with each pixel is coupled to at least one bitline of the bitline array. The output stage is coupled to generate an output voltage indicative of any of the second input nodes being lower than the reference voltage.

Growing community of inventors

San Jose, CA, United States of America

Wen He