Industrial Technology Research Institute

Alpha Networks Inc.

Treatyou Medical Technology Corporation

Mosel Vitelic Corporation

National Central University

D-link Corporation

Wen-Ching Wu

Yeong-Jar Chang

Kun-Lun Luo

Cheng-Wen Wu

Chin-Lung Su

Pei-Wen Luo

Shen-Tien Lin

Shiow-Chen Wang

Wen-Feng Yang

Rei-Fu Huang

Hui-Min Wang

Ji-Jan Chen

Chin-Long Wey

Hsiao-Ping Hsieh

Jung-Chi Ho

Liang-Chia Cheng

Thanku Shieh

Hsien Hsiang Lin

Jwu-E Chen

Chia-Jen Lee

A yield evaluating apparatus and a method thereof are provided. The yield evaluating apparatus includes a spatial correlation module. The spatial correlation module receives at least one process-related data and a plurality of circuit layouts and obtains a correlation coefficient between unit elements in the circuit layouts according to the process-related data. The spatial correlation module calculates a spatial correlation between elements in each of the circuit layouts according to the correlation coefficient and selects one of the circuit layouts according to the spatial correlations.

Yield evaluating apparatus and method thereof

The invention is a can-filter structure of an oxygen concentrator, which includes: a first can-filter having filter material; a second can-filter having filter material; and an outlet cover. The first can-filter includes an air inlet provided at the entrance side of the first can-filter and a first conical joint formed at the exit side of the first can-filter, wherein the first conical joint is hollow and at least one recess is provided on the outer surface thereof. The second can-filter includes a second conical joint formed at the entrance side of the second can-filter, wherein the second conical joint is hollow, and at least one engaging hook corresponding to the recess is provided on the inner surface thereof for coupling to the first conical joint. The outlet cover is provided at the exit side of the second can-filter and is coupled thereto by ultrasonic fusion.

Can-filter structure of oxygen concentrator

The invention is an assembly structure that allows molecular sieves and can-filters be fast assembled in an oxygen concentrator. The structure includes: a molecular sieve and can-filter set, which is composed of at least two molecular sieves and at least one can-filter; a support frame, which includes a base plate and a frame fixed on the base plate in an upright position, and the frame has a first support plate having a plurality of through holes and a second support plate having a hole, wherein the hole of the second support plate is for one of the at least one can-filter to pass through; and a plurality of bend joints, each of which including: a thin plate portion formed at a first end, wherein an opening is provided in the center of the thin plate portion; and a plurality of annular barbed portions provided near a second end, such that a flexible conduit/hose connected thereto does not detach easily and the air tightness is increased, wherein the second end of each bend joint passes through one of the through holes of the first support plate while the thin plate portion of each bend joint is fixed to the first support plate via a second fastener.

Quickly assemblable structure of molecular sieves and can filters in oxygen concentrator

Disclosed is a build-in self-diagnosis and repair method and apparatus in a memory with syndrome identification. It applies a fail-pattern identification and a syndrome-format structure to identify at least one type of faulty syndrome in the memory during a memory testing, then generates and exports fault syndrome information associated with the corresponding faulty syndrome. According to the fault syndrome information, the method applies a redundancy analysis algorithm, allocates spare memory elements and repairs the faulty cells in the memory. The syndrome-format structure respectively applies single-faulty-word-syndrome format, faulty-row-segment-syndrome format, and faulty-column-segment-syndrome format for different faulty syndromes, such as faulty row segments and single faulty words, faulty column segments and single faulty words, all of single faulty words, faulty row segments and faulty column segments, and so on.

Method and apparatus of build-in self-diagnosis and repair in a memory with syndrome identification

A wrapper testing circuit of system-on-a-chip for electrical tests of at least a core circuit of an integrated circuit and a wrapper testing method thereof are provided. A controller outputs control signals and test signals and receives result signals executed by the core circuit. The wrapper testing circuit comprises a decoding logic and a plurality of wrapper boundary registers. The decoding logic has a signal decoding table which receives and decodes the control signals and then issues decoded signals according to the signal decoding table. The WBR shifts, updates and captures the test signals for the core circuit to execute and output the result signals according to the decoded signals. In comparison with prior art, the testing time is reduced.

Wrapper testing circuits and method thereof for system-on-a-chip

The present invention is to provide a dual-purpose position structure used as a hook and a dock comprising a base and another base, wherein the base is sheathed into the another base along a guiding track and two sides of a sliding trench of the base by using a guiding trench and two sides of a sliding plate of the another base, the another base is adjusted by engaging between a saw-toothed part of an elastic arm and a saw-toothed surface of the guiding track to form a dock with a size-adjustable containing space for setting an electronic apparatus therein or being hanged inversely on an office partition as a hook. At least one buckling device located on the supporting plate of the another base can be assembled with at least another buckling device located on a surface of the electronic apparatus.

Dual-purpose position structure used as hook and dock

The present invention provides a method and apparatus for a memory build-in self-diagnosis and repair with syndrome identification. It uses a fail-pattern identification and a syndrome-format structure to identify faulty rows, faulty columns and single faulty word in the memory during the testing process, then exports the syndrome information. Based on the syndrome information, a redundancy analysis algorithm is applied to allocate the spare memory elements repairing the faulty memory cells. It has a sequencer with enhanced fault syndrome identification, a build-in redundancy-analysis circuit with improved redundancy utilization, and an address reconfigurable circuit with reduced timing penalty during normal access. The invention reduces the occupation time and the required capture memory space in the automatic test equipment. It also increases the repair rate and reduces the required area overhead.

The present invention discloses an antenna with a fixed base rotary positioning structure, which can be placed on a table or hung on a wall, comprising: a fixed base; a protrusion disposed on the fixed base and having an open end on one side; a chamber enclosed by the rest of three sides; a pivotal axial hole and an arc groove being correspondingly disposed on both sides of the inner wall of the protrusion, such that the pivotal axial hole and the arc groove precisely and pivotally coupling the pivotal axis and the protruded fixing point to the two corresponding sides at one end of the antenna, and the antenna using such pivotal axis as the rotary axis to adjust the antenna to any angle by the open end of the protrusion.

Antenna and fixed base rotary positioning structure

The present invention is to provide a case comprising a structure for fastening a sliding button having a fixing member and a manipulating member together forming an L-shaped member, two spaced ribs provided on an inner surface of the manipulating member above the fixing member, and a projection provided on an outer surface of the manipulating member and adapted to insert through an opening of the case and project therefrom to outside of the case while placing the sliding button in the case; and a circuit board threadedly secured to a bottom of the case for clamping the fixing member and thus fastening the sliding button.

Case with sliding button fastening structure

IC with built-in self-test and design method thereof. The IC comprises an SD-ADC and a Dft circuit. The Dft circuit uses a digital stimulus signal to solve the deadlock problem of the on-chip analog testing and avoid thermal noise. Moreover, according to the design method of the IC, circuits having different specification can use the Dft circuit without performance degradation for original SD-ADC.

IC with built-in self-test and design method thereof

A built-in jitter measurement circuit for a VCO (voltage-controlled oscillator) and a PLL (phase-locked loop) is disclosed. The circuit includes a divider for dividing frequency of a signal, a time to digital converter (TDC) for converting the period of the divided signal into digital values, a variance calculator for calculating variance of the period of the divided signal, a mean calculator for calculating mean value of the period of the divided signal, a encoder and counter for encoding and calculating the period of the divided signal, and a state controller as a controller for all other components. The circuit disclosed utilizes output clock of an opened-loop circuit to be measured and a divider for increasing jitter of the original signal. By measuring the bandwidth of a closed-loop circuit, accordingly, jitter of output clock of an opened-loop or an closed-loop circuit is measured by correlating the measured bandwidth and the jitter values from extrapolation.

Built-in jitter measurement circuit for voltage controlled oscillator and phase locked loop

A teaching tool for a robot arm for wafer reaction ovens is provided to anchor the robot arm with respect to a tray located inside a reaction oven. The teaching tool provides an upper flange for maintaining a spacing between a handle of the robot arm and a door of the oven, a position width for keeping the teaching tool aligning with a center line of the tray, and a lower tunnel aligning with the center line for allowing a blade of the robot arm to contact closely and horizontally from a lower position and thus for maintaining a position height between the blade and a floor of the reaction oven. By providing the teaching tool, easy blind calibration with multiple contact points between the robot arm and the oven can be performed so that possible efficiency down and cost up from an ill-calibration can be reduced to a minimum.

Teaching tool for a robot arm for wafer reaction ovens

Disclosed are a device and method therefor for ENOB (effective number of bits) estimation for an ADC (analog-to-digital converter) based on dynamic deviation, wherein the correlation between dynamic deviation and ENOB is analyzed so as to provide a novel device and method therefor to estimate and calculate ENOB for an ADC. Dynamic deviation, provided in the present invention, can serve as a novel parameter for use in evaluation of the performance of an ADC. The present invention further provides a model related to the relation of distribution of dynamic deviation and input frequency, wherein ENOB can be therefore predicted for higher input frequency for an ADC without a high-quality signal generator by measuring dynamic deviation for lower input frequency.

Growing community of inventors

Hsinchu, Taiwan

Wen-Ching Wu