Siliconware Precision Industries Co., Ltd.

Wen-Chin Liang

Cheng-Shao Chen

Po-Wen Hsiao

Cheng-Tsai Hsieh

Yung-Ming Wang

Chao-Ming Tu

Chih-Ming Yang

A control method is provided and used to place a target object on a test platform in a cabin of a testing device, to sense the temperature of the target object by a temperature response structure, and then to receive temperature signals of the temperature response structure by a controller, where the controller can regulate the pressure inside the cabin to control the air pressure of the cabin, so that the target object can still maintain good heat dissipation under high power consumption.

Testing device for burn-in test operations and control method thereof

Provided is a testing method including: disposing a wafer on a working platform of a testing device; and moving a circuit board of the testing device relative to the working platform by a movement assembly of the testing device so as to allow at least two testing ports of the circuit board to test two chips of the wafer, respectively. Further, the two testing ports have different testing functions. Therefore, during the wafer testing process, a single testing device can perform multiple testing operations.

Testing device and method

Growing community of inventors

Taichung, Taiwan

Wen-Chin Liang