Nuctech Company Limited

Tsinghua University

Other

Weizhen Wang

Zhiqiang Chen

Wei Li

Yuanjing Li

Jianmin Li

Yulan Li

Chunguang Zong

Quanwei Song

Hao Yu

Dongyu Wang

Li Ni Zhang

Shangmin Sun

Jingyu Gu

Yu Hu

Bicheng Liu

Haojie Chi

Yinong Liu

Ying Li

Kejun Kang

Xuewu Wang

Junli Li

Tao Xue

Hui Gong

Yaohong Liu

Qingjun Zhang

Chuanxiang Tang

Li Zhang

Huaping Tang

Weifeng Yu

Yigang Yang

Guangming Xu

Wei Yin

Yuan Ma

Yucheng Wu

Qinjian Zhang

Ming Zeng

Shenjin Ming

Weiqiang Guan

Zhen Tan

Chaunxiang Tang

The present invention relates to a backscatter imaging device, a control method and an inspection system. The backscatter imaging device includes a ray source assembly configured to emit rays to a scanning area; a backscatter detector array including a plurality of backscattering detectors and configured to receive scattered photons when the rays are backscattered by an object within the scanning area; and a first collimator assembly including a plurality of first collimating channels corresponding to the plurality of backscatter detectors respectively, arranged on one side of the backscatter detector array adjacent to the scanning area, and configured to align the scattered photons when the rays are backscattered by the object, and the plurality of backscatter detectors receive scattered photons corresponding to a plurality of depths in the object respectively; and at least part of the plurality of first collimation channels have an adjustable collimation angle.

Backscatter imaging device, control method and inspection system

The present disclosure provides a method and device for correcting a scanned image, and an image scanning system, and relates to the field of image scanning. The method includes obtaining a scanned image of a scanned object, detecting one or more reference objects from the scanned image, determining a deformation parameter of each reference object of the one or more reference objects based on preset a standard parameter of the each reference object, and correcting the scanned image based on the deformation parameters of the one or more reference objects.

Method and device for correcting a scanned image and image scanning system

The present disclosure provides a back scattering inspection system and a back scattering inspection method. The back scattering inspection system includes a frame and a back scattering inspection device. The rack includes a track arranged vertically or obliquely relative to the ground, and a space enclosed by the track forms an inspection channel; and the back scattering inspection device includes a back scattering ray emitting device and a back scattering detector, and the back scattering inspection device is movably disposed on the track for inspecting an inspected object passing through the inspection channel. The back scattering inspection system can perform back scattering inspection on a plurality of surfaces of the inspected object.

Back scattering inspection system and back scattering inspection method

The present disclosure discloses a vehicle-mounted type back scattering inspection system. The vehicle-mounted type back scattering inspection system includes a carriage and a back scattering imaging device, the scanning range of the back scattering imaging device is variable. As the scanning range of the back scattering imaging device of the present disclosure is variably set, the inspection range of the back scattering imaging device can be expanded.

Vehicle-mounted type back scattering inspection system

The present disclosure discloses a vehicle-mounted type back scattering inspection system. The back scattering imaging device has a vehicle-mounted working state and a ground working state, and in the vehicle-mounted working state, the back scattering imaging device performs inspection work in a carriage; in the ground working state, the back scattering imaging device performs the inspection work on the ground at the outside of the carriage; and the back scattering imaging device is separately arranged relative to the carriage and is movable between the carriage and the ground to switch between the vehicle-mounted working state and the ground working state.

The present disclosure discloses a radiation inspection system and a radiation inspection method. The radiation inspection system comprises a radiation source and a beam modulating device. The beam modulating device comprises a first collimating structure disposed at a beam exit side of the radiation source and a second collimating structure disposed at a beam exit side of the first collimating structure. The second collimating structure is movable relative to the first collimating structure to change a relative position of the first collimating port of the first collimating structure with the second collimating port of the second collimating structure, and the beam modulating device is shifted between a first operational state in which the beam modulating device modulates an initial beam into a fan beam, and a second operational state in which the beam modulating device modulates the initial beam into a pencil beam variable in position.

Radiation inspection system and radiation inspection method

The present disclosure provides a system and method for inspecting an aircraft. An X-ray/Gamma ray radiation source and a detector are located at above and below a fuselage of an aircraft, respectively. The X-ray/Gamma ray radiation source emits a beam of radiation[ ], wherein the X-ray/Gamma ray radiation[ ] passes through the aircraft to be inspected. The detector receives and converts the beam of X-ray/Gamma ray radiation[ ] that has passed through the aircraft to an output signal, and the system generates a vertical transmission image in real time.

Systems and methods for inspecting an aircraft

The present application discloses a detector module, which is arranged on a detector arm, comprising one or a plurality of detector units arranged in a scattered configuration, wherein each of the detector units in the detector module is installed aiming at a beam center of a ray source, thus improving imaging quality and reducing the size of a detector frame drastically.

Detector in a scattered configuration applied to X/gamma ray container/vehicle inspection equipment

The present disclosure discloses an alignment system and an alignment method for a container or vehicle inspection system, and an inspection system. The inspection system comprises comprising an ray source, a collimator, a detector arm and a detector module mounted on a detector arm, the ray source, the collimator and the detector module are arranged to form an inspection passage, a ray beam emitted from the ray source passes through collimator and irradiates onto an inspected object, and an attenuated ray beam is collected by the detector module so as to complete inspection. The alignment system comprises a measuring module arranged to receive the ray beam emitted from the collimator and to measure the ray beam so as to determine positions and orientations of the ray source and the collimator. With the alignment method, alignment between a center point of the ray source, a central line of a detector tip and a central line of the collimator may be more accurately measured.

Alignment system and method for container or vehicle inspection system

A vehicle mounted mobile container or vehicle inspection system, including: a radiation source, a movable vehicle for carrying the inspection system, and a detector arm rack which has a horizontal arm and a vertical arm, a first end of the horizontal arm is connected to the vehicle and a second end thereof is connected to an end of the vertical arm. The horizontal arm and the vertical arm are connected by a pivotal connecting device such that the vertical arm may pivot in a vertical plane, and the horizontal arm and the vertical arm may be retracted in a same horizontal plane. The novel arm rack construction may reduce the space occupied by it on top of the scanning vehicle after the arm rack is stowed so as to reduce the eight of the scanning vehicle under running condition.

Vehicle mounted mobile container or vehicle inspection system

Growing community of inventors

Beijing, China

Weizhen Wang