Growing community of inventors

Cupertino, CA, United States of America

Weize Xie

Average Co-Inventor Count = 4.25

ph-index = 5

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 65

Weize XieNorman H Chang (7 patents)Weize XieShen Lin (7 patents)Weize XieOsamu Samuel Nakagawa (6 patents)Weize XieKeunmyung Lee (1 patent)Weize XieEileen H You (1 patent)Weize XieRichard M Chou (1 patent)Weize XieJohn F MacDonald (1 patent)Weize XieYu Cao (1 patent)Weize XieXuejue Huang (1 patent)Weize XieKenynmyung Lee (1 patent)Weize XieWeize Xie (8 patents)Norman H ChangNorman H Chang (35 patents)Shen LinShen Lin (9 patents)Osamu Samuel NakagawaOsamu Samuel Nakagawa (11 patents)Keunmyung LeeKeunmyung Lee (9 patents)Eileen H YouEileen H You (4 patents)Richard M ChouRichard M Chou (4 patents)John F MacDonaldJohn F MacDonald (3 patents)Yu CaoYu Cao (1 patent)Xuejue HuangXuejue Huang (1 patent)Kenynmyung LeeKenynmyung Lee (1 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Hewlett-packard Development Company, L.p. (5 from 27,394 patents)

2. Sun Microsystems, Inc. (1 from 7,642 patents)

3. Hewlett-packard Development, L.p. (1 from 89 patents)

4. Apache Design Solutions, Inc. (1 from 5 patents)


8 patents:

1. 6981230 - On-chip power-ground inductance modeling using effective self-loop-inductance

2. 6981231 - System and method to reduce leakage power in an electronic device

3. 6925555 - System and method for determining a plurality of clock delay values using an optimization algorithm

4. 6661281 - Method for reducing current surge using multi-stage ramp shunting

5. 6621305 - Partial swing low power CMOS logic circuits

6. 6566924 - Parallel push algorithm detecting constraints to minimize clock skew

7. 6567960 - System for improving circuit simulations by utilizing a simplified circuit model based on effective capacitance and inductance values

8. 6449754 - Method of measuring the accuracy of parasitic capacitance extraction

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12/4/2025
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