Shanghaitech University

Weixiong Jiang

Yajun Ha

An automatic overclocking controller based on circuit delay measurement is provided, including a central processing unit (CPU), a clock generator, and a timing delay monitor (TDM) controller. Compared with the prior art, the present disclosure has following innovative points: A two-dimension-multi-frame fusion (2D-MFF) technology is used to process a sampling result, to eliminate sampling noise, and an automatic overclocking controller running on a heterogeneous field programmable gate array (FPGA) can automatically search for a highest frequency at which an accelerator can operate safely.

Automatic overclocking controller based on circuit delay measurement

A pure integer quantization method for a lightweight neural network (LNN) is provided. The method includes the following steps: acquiring a maximum value of each pixel in each of the channels of the feature map of a current layer; dividing a value of each pixel in each of the channels of the feature map by a t-th power of the maximum value, t∈[0,1]; multiplying a weight in each of the channels by the maximum value of each pixel in each of the channels of the corresponding feature map; and convolving the processed feature map with the processed weight to acquire the feature map of a next layer. The algorithm is verified on SkyNet and MobileNet respectively, and lossless INT8 quantization on SkyNet and maximum quantization accuracy so far on MobileNetv2 are achieved.

Pure integer quantization method for lightweight neural network (LNN)

A full-path circuit delay measurement device for a field-programmable gate array (FPGA) and a measurement method are provided. The measurement device includes two shadow registers and a phase-shifted clock, where the two shadow registers take an output of a measured combinational logic circuit as a clock and sample the phase-shifted clock SCLK as data; the two shadow registers are respectively triggered on rising and falling edges of the output of the measured combinational logic circuit to sample the phase-shifted clock; outputs of the two shadow registers are delivered by an OR gate as an input into a synchronization register; a clock of the synchronization register serves as a clock MCLK of the measured combinational logic circuit; an output of the synchronization register serves as that of the circuit delay measurement device; the phase-shifted clock SCLK and the clock MCLK of the measured combinational logic circuit have the same frequency.

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Shanghai, China

Weixiong Jiang