Xilinx, Inc.

Weiguang Lu

Karthy Rajasekharan

Chen Wei Tseng

David P Schultz

Eric E Edwards

Subodh Kumar

Matthew Pond Baker

Michelle Zeng

Stephen M Trimberger

Steven P Young

Brian C Gaide

Paige A Kolze

Shidong Zhou

Uma E Durairajan

Jing Jing Chen

Carl M Stern

William W Stiehl

Robert M Balzli, Jr

Paul-Hugo Lamarche

Joe Eddie Leyba, Ii

Michael Tsivyan

Sourabh Goyal

Santosh Yachareni

Rafael C Camarota

Matthew H Klein

Jun Liu

Ting Lu

Mehul R Vashi

Kumar Rahul

Kam-Wing Li

Fu-Hing Ho

David Robinson

Narendra Kumar Pulipati

Hsiao H Chen

Derrick S Woods

Aditya Chaubal

Ui Sun Han

Restu I Ismail

Sree R K C Saraswatula

Christopher Y Karman

Henry Fu

Priyanka Agrawal

Sree Rkc Saraswatula

Joe Eddie Ii Leyba

First and second sensing circuits are coupled to first and second data lines, respectively, and sense levels of current leakage or a memory cell state on the first and second data lines. First and second keeper circuits are coupled to the first and second data lines, respectively, and drive the first and second data lines by a voltage supply through biased transistors. First and second leakage latches are coupled to receive and latch state of signals output from the first and second sensing circuits, respectively. A control circuit is coupled to the first leakage latch, second leakage latch, and outputs of the first and second sensing circuits. The control circuit is configured to select either the signal output from the first sensing circuit or the signal output from the second sensing circuit in response to states of the first and second leakage latches.

Current leakage management controller for reading from memory cells

An example configuration system for a programmable device includes: a configuration memory read/write unit configured to receive configuration data for storage in a configuration memory of the programmable device, the configuration memory comprising a plurality of frames; a plurality of configuration memory read/write controllers coupled to the configuration memory read/write unit; a plurality of fabric sub-regions (FSRs) respectively coupled to the plurality of configuration memory read/write controllers, each FSR including a pipeline of memory cells of the configuration memory disposed between buffers and a configuration memory read/write pipeline unit coupled between the pipeline and a next one of the plurality of FSRs.

Programmable device configuration memory system

Embodiments herein describe a reconfigurable integrated circuit (IC) where data can be retained in memory when performing a partial reconfiguration. Partial reconfiguration includes reconfiguring programmable logic in the IC while certain functions of the IC remain operational or active. In one embodiment, the reconfigurable IC includes control logic for saving or retaining data in the IC during a partial reconfiguration. That is, rather than clearing the memory elements, the user can specify that the memory blocks containing certain data should be retained while the other memory blocks can be cleared. In this manner, the data can be retained in the IC during a partial reconfiguration which saves time, power, and cost. Once partial reconfiguration is complete, the newly configured programmable logic can retrieve and process the saved data from the on-chip memory.

Retaining memory during partial reconfiguration

Examples herein describe a self-test process where an integrated circuit includes a test controller responsible for testing a plurality of frames in the memory of an integrated circuit. The test controller can receive a test pattern which the controller duplicates and stores in each of the plurality of frames. However, frames may be non-uniform meaning the frames have varying sizes. As such, some of the frames may only store parts of the test pattern rather than all of it. In any case, the test controller reads out the stored data and generates a checksum which can then be compared to a baseline checksum generated from simulating the integrated circuit using design code to determine whether there is a manufacturing defect in the frames.

Built in configuration memory test

Examples described herein provide for a boundary logic interface (BLI) to a programmable logic region in an integrated circuit (IC), and methods for operating such IC. An example IC includes a programmable logic region and boundary logic interfaces. The programmable logic region includes columns of interconnect elements disposed between columns of logic elements. The boundary logic interfaces are at respective ends of and communicatively connected to the columns of interconnect elements. The boundary logic interfaces are outside of a boundary of the programmable logic region. A first boundary logic interface (BLI) of the boundary logic interfaces is configured to be communicatively connected to an exterior circuit. The first BLI includes an interface configured to communicate a signal between the exterior circuit and the programmable logic region.

Boundary logic interface

Apparatus and method relate generally to a configuration engine. In one such configuration engine for a programmable circuit, a frame counter includes a cascade of frame incrementer circuits associated with columns for a row of circuit blocks. Each frame incrementer circuit is configured to provide frame sums for frames associated with the circuit blocks. The frame counter is configured to sequentially add the frame sums for the columns to provide corresponding frame totals respectively for circuit types of the circuit blocks. A termination circuit is configured to multiplex the frame totals onto a data bus. A row controller is configured to initiate the frame counter and to selectively access the frame totals provided to the data bus.

Configuration engine for a programmable circuit

Apparatus and associated methods relate to a consolidated power-on-reset system (PORS) at a system-on-chip (SoC) level. In an illustrative example, an integrated circuit may include a first power domain and a second power region. A level shifter circuit may be coupled to translate data from the first power domain to the second power domain. A PORS including a voltage detection circuit, a glitch filter circuit, and logic gates may be configured to generate isolation signals between the first power domain and the second power domain. The level shifter circuit may be enabled in response to the generated isolation signals. By using the isolation signals, multiple power domains on IC may be managed comprehensively during power-up to avoid unstable operation.

System and method for SoC power-up sequencing

Decompressing a data set includes inputting data units to a decompression circuit and comparing each input data unit to a run value and to a substitute value. In response to the data unit being not equal to the run value or the substitute value, the decompression circuit outputs the value of the input data unit; in response to the input data unit having the run value and a succeeding data unit having a value N not equal to zero or one, the decompression circuit outputs multiple data units having the run value based on the value N; in response to input data unit having the substitute value, the decompression circuit outputs one data unit having the run value; and in response to one input data unit having the run value and a succeeding data unit equal to zero or one, the decompression circuit outputs one data unit of the substitute value.

Run length compression and decompression using an alternative value for single occurrences of a run value

In an example, a memory circuit in a programmable integrated circuit (IC) includes: a control port and a clock port; a configurable random access memory (RAM) having a control input and a clock input; input multiplexer logic coupled to the control input and the clock input; and a state machine coupled to the input multiplexer logic and configuration logic of the programmable IC, the state machine configured to: in response to being enabled by the configuration logic, control the input multiplexer logic to switch a connection of the control input from the control port to the state machine and, subsequently, switch a connection of the clock input from the clock port to a configuration clock source; and in response to being disabled by the configuration logic, control the input multiplexer logic to switch the connection of the clock input from the configuration clock source to the clock port and, subsequently, switch the connection of the control input from the state machine to the control port.

Implementing robust readback capture in a programmable integrated circuit

Circuits and methods for initializing a memory. Each row of the memory includes data bits and associated parity bits. A write buffer contains bit values for initializing the memory, and a control circuit performs a first set of write operations that write values from the write buffer to the data bits of the memory without writing values to the associated parity bits. The write buffer performs a second set of write operations that write values from the write buffer to the parity bits associated with the data bits without writing data to the data bits.

Memory initialization

A circuit arrangement for enabling a partial reconfiguration of a circuit implemented in an integrated circuit device is described. The circuit arrangement comprises a plurality of circuit blocks, wherein each circuit block is configurable to implement a predetermined function and comprises a control circuit configured to receive a global enable signal and a plurality of global reconfiguration signals; and a routing network coupled to the plurality of circuit blocks for routing the global enable signal and the plurality of global reconfiguration signals to each circuit block of the plurality of circuit blocks; wherein each circuit block of the plurality of circuit blocks is configured to independently receive a local enable signal enabling a partial reconfiguration of the circuit in response to the plurality of global reconfiguration signals.

Circuit arrangement for and a method of enabling a partial reconfiguration of a circuit implemented in an integrated circuit device

A method of processor operation using an integrated circuit (IC) can include loading encrypted program code into the IC through a configuration port of the IC and decrypting the encrypted program code using configuration circuitry of the IC. Decryption of the encrypted program code can result in decrypted program code which can be provided to a target destination.

Secure processor operation using integrated circuit configuration circuitry

Methods and circuits are disclosed for backing up the value of a bi-stable circuit included in a set of programmable logic circuits of a programmable IC. The programmable logic circuits are configured to implement logic circuits having functions based on data values stored in a used portion of a plurality of configuration memory cells. The programmable IC includes a backup control circuit configured to back up and restore the value of the bi-stable circuit. In response to a first signal, a first data value stored by the bi-stable circuit is retrieved and stored in a first one of the plurality of configuration memory cells that is unused in implementing the logic circuits. In response to a second signal, the first data value is retrieved from the first one of the plurality of configuration memory cells and stored in the bi-stable circuit.

Single event upset mitigation

Approaches for partially reconfiguring a frame are disclosed. In one approach, a circuit arrangement includes programmable resources, frames of configuration memory cells, and partial configuration control memory cells. Each frame includes a plurality of subsets of configuration memory cells, and each subset configures one of the programmable resources. Each partial configuration control memory cell is coupled to a respective one of the subsets. Responsive to a first partial bitstream that includes a quantity of configuration data for all the subsets of configuration cells of a first frame of the plurality of frames, each subset of the configuration memory cells of the first frame is configurable or not configurable responsive to the state of the associated partial configuration control memory cell.

Partially programming an integrated circuit using control memory cells

Approaches for mitigating single event upsets (SEUs) in a circuit arrangement. In response to each bit error of a plurality of bit errors, an error address indicative of the bit error in a configuration memory cell in the circuit arrangement is translated into a non-volatile memory address. A partial bitstream at the non-volatile memory address is read from a non-volatile memory. Successive partial bitstreams read in response to successive ones of the bit errors are alternately transmitted to first and second internal configuration ports. A subset of configuration memory cells of the circuit arrangement, including the configuration memory cell referenced by the error address, is reconfigured with the partial bitstream.

Bit error mitigation

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San Jose, CA, United States of America

Weiguang Lu