Other

Evigia Systems, Inc.

Picocal, Inc

Bellutech LLC

Micro Inertial LLC

Weibin Zhu

Navid Yazdi

Angelo Gaitas

Amar Sarbbasesh Basu

Yafan Zhang

Bhaskar Mitra

Sensors, systems, and methods for monitoring environmental conditions, such as physical, electromagnetic, thermal, and/or chemical parameters within an environment, over extended periods of time with the use of one or more electromechanical sensing devices and electronic circuitry for processing an output of the sensing devices. The sensing devices each include a cantilevered structure and at least one contact configured for contact-mode operation with the cantilevered structure in response to the cantilevered structure deflecting toward or away from the contact when exposed to the parameter of interest. The cantilevered structure has at least first and second beams of dissimilar materials, at least one of which has at least one property that changes as a result of exposure to the parameter.

Sensing devices, sensors, and methods for monitoring environmental conditions

The present invention generally relates to a system and method for high accuracy temperature control of an oven used to operate an electronic device, sensor, or resonator at a fixed temperature. The fixed temperature operation may result in high stability and operation accuracy of the devices across varying environment temperature conditions. Specifically, the present invention relates to systems and methods that enable realizing, sensing, and controlling the temperature of an ovenized device with high temperature control, accuracy, relaxed temperature sense, and control electronics requirements.

System and method for ovenized device temperature control

The present invention generally relates to a system and method for high accuracy temperature control of an oven used to operate an electronic device, sensor or resonator ('device') at a fixed temperature. The fixed temperature operation may result in high stability and operation accuracy of the devices across varying environment temperature conditions. Specifically, the present invention relates to systems and methods that enable realizing, sensing, and controlling the temperature of an ovenized device with high temperature control, accuracy, relaxed temperature sense, and control electronics requirements.

The present invention generally relates to an ovenized platform and a fabrication process thereof. Specifically, the invention relates to an ovenized hybrid Si/SiOplatform compatible with typical CMOS and MEMS fabrication processes and methods of its manufacture. Embodiments of the invention may include support arms, CMOS circuitry, temperature sensors, IMUs, and/or heaters among other elements.

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The present invention generally relates to a system and method for the precise measurement of acceleration, movement, and other forces imparted on a body or object. Specifically, the invention relates to a system and method for measuring head accelerations in helmeted activities including, but not limited to, football, ice hockey, and lacrosse. Certain embodiments of the invention may include a wireless link to a remote recording station with near real-time data analysis and reporting of force and kinetics measured by the system.

System and method for head acceleration measurement in helmeted activities

Processes and fixtures for producing electromechanical devices, and particularly three-dimensional electromechanical devices such as inertial measurement units (IMUs), through the use of a fabrication process and a three-dimensional assembly process that entail joining single-axis device-IC chips while positioned within a mounting fixture that maintains the orientations and relative positions of the chips during the joining operation.

Processes and mounting fixtures for fabricating electromechanical devices and devices formed therewith

The present invention is a method for localized chemical vapor deposition (CVD) for localized growing for example for carbon nanotubes (CNT), nanowires, and oxidation using a heated tip or an array of heated tips to locally heat the area of interest. As the tips moved, material such as CNTs grows in the direction of movement. The Scanning Probe Growth (SPG) or nanoCVD technique has similarities to the CVD growth; however it allows for controlled synthesis and direction and eliminates the need for masks.

Growing community of inventors

Saline, MI, United States of America

Weibin Zhu