Cadence Design Systems, Inc.

Weibin Ding

Yan Chen

Chao Luo

Ping-Chih Wu

Kit Lam Cheong

Xin-Lei Zhang

Louis Liu

Yiqun Ding

The present disclosure relates to a computer-implemented method for routing in an electronic design. Embodiments may include receiving, using at least one processor, global route data associated with an electronic design as an input and generating detail route data, based upon, at least in part, the global route data. Embodiments may further include transforming one or more of the detail route data and the global route data into at least one input feature and at least one output result of a deep neural network. Embodiments may also include training the deep neural network with the global route data and the detail route data and predicting an output associated with a detail route based upon, at least in part, a trained deep neural network model.

System, method, and computer-program product for routing in an electronic design using deep learning

The present disclosure relates to a computer-implemented method for routing in an electronic design. Embodiments may include receiving, using at least one processor, global route data associated with an electronic design as an input and generating detail route data, based upon, at least in part, the global route data. Embodiments may further include transforming one or more of the detail route data and the global route data into at least one input feature and at least one output result of a deep neural network. Embodiments may also include training the deep neural network with the global route data and the detail route data and predicting an output associated with a detail route based upon, at least in part, a trained deep neural network model. Embodiments may also include generating routing information for each routing grid.

The present invention relates to performing early design for testing (DFT)-aware prototyping of a design. Unlike prior approaches, the improvement analyzes and considers the impact of test structures at a very early stage of the design process. This allows test structures to be considered and addressed in a more efficient iterative and incremental way, which reduces design cycle time and reduces costs.

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Shanghai, China

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