Applied Materials, Inc.

Wei Zhao

Hans-Joachim Ludwig Gossmann

Wei Zou

Supakit Charnvanichborikarn

Qintao Zhang

Aseem Kumar Srivastava

Stanislav S Todorov

William R Bogiages, Jr

Dennis Rodier

Richard White

Alexander K Eidukonis

A method of operating a beamline ion implanter may include performing, in an ion implanter, a first implant procedure to implant a dopant of a first polarity into a given semiconductor substrate, and generating an estimated implant dose of the dopant of the first polarity based upon a set of filtered information, generated by the first implant procedure. The method may also include calculating an actual implant dose of the dopant of the first polarity using a predictive model based upon the estimated implant dose, and performing, in the ion implanter, an adjusted second implant procedure to implant a dopant of a second polarity into a select semiconductor substrate, based upon the actual implant dose.

Method and apparatus for controlled ion implantation

A method of performing an ion implantation process using a beam-line ion implanter, including disposing a substrate on a platen, analyzing the substrate using metrology components, communicating data relating to the analysis of the substrate to a feedforward controller, processing the data using a predictive model executed by the feedforward controller to compensate for variations in the substrate and to compensate for variations in components of the beam-line ion implanter based on historical data collected from previous implantation operations, and using output from the predictive model to adjust operational parameters of the beam-line ion implanter.

System and method for hi-precision ion implantation

Growing community of inventors

Lexington, MA, United States of America

Wei Zhao