Jilin University

Wei Zhang

Hongwei Zhao

Luquan Ren

Zhichao Ma

Shuai Tong

Hongcai Xie

Jiakai Li

Chaofan Li

Junming Xiong

Zixin Guo

Guoxiang Shen

Yicheng Li

Zaizheng Yang

Jiazheng Sun

Wenyang Zhao

Boyi Kou

Shengteng Zhao

Zheng Yang

Zhengchen Han

Zimiao Wang

Ziyi Wu

Yifan Liu

The present invention provides a micro-nano impact indentation testing device and method based on cyclic refrigeration, and relates to the technical field of material property testing. The testing device comprises a pressure rod and a stage for low-temperature micro-nano impact indentation testing, and a refrigeration device for refrigerating and cooling the pressure rod and the stage, wherein the refrigeration device refrigerates the pressure rod and the stage by adopting an embedded channel, a cold conduction wire connected to the pressure rod and the stage and a refrigeration balancer in contact with the cold conduction wire are arranged between the pressure rod and the stage, and the temperature of the pressure rod and the temperature of the stage are stabilized at a common temperature point by the cold conduction wire and the refrigeration balancer together.

Micro-nano impact indentation testing device and method based on cyclic refrigeration

The present invention provides a dynamic acoustic emission in-situ testing device and method for an electromagnetic rail launcher. The device comprises an armature, a guide rail and a support base, wherein the support base comprises an upper support base and a lower support base which are opposite to each other and are vertically arranged, a distance between the upper support base and the lower support base can be adjusted through bolts, the guide rail is vertically arranged between the upper support base and the lower support base, the armature is clamped in the guide rail, a plurality of groups of static acoustic emission sensors are arranged along the guide rail, a dynamic acoustic emission sensor is arranged on the armature. The method can comprehensively reveal the current-carrying friction damage mechanism of the armature-rail interface under the variable magnetic field intensity condition.

Dynamic acoustic emission in-situ testing device and method for electromagnetic rail launcher

The present invention discloses a pin-on-disk type in-situ current-carrying friction testing system, and belongs to the technical field of friction performance testing. The friction testing system includes a pin-on-disk type friction pair, a current loading mechanism, and a magnetic field generating mechanism. The current loading mechanism includes a conductive terminal abutting against an annular sidewall of a disk specimen and used to guide a current in the disk specimen to flow along a horizontal direction, and the magnetic field generating mechanism is used to generate a magnetic field. When a pin specimen and a disk specimen rotate relatively, the pin specimen, the conductive terminal, and the magnetic field generating mechanism are relatively stationary, and an Ampere force generated by the current in the disk specimen flowing in the horizontal direction under the action of the magnetic field faces a support platform.

Pin-on-disk type in-situ current-carrying friction testing system

The present invention discloses a rapid dot matrix micro-nano impact indentation testing system. The rapid dot matrix micro-nano impact indentation testing system comprises a three-dimensional electric positioning module, wherein the three-dimensional electric positioning module comprises an XY translation stage and a Z-axis lifting stage; a dot matrix impact indentation module, wherein the dot matrix impact indentation module comprises a three-degree-of-freedom piezoelectric platform arranged on the Z-axis lifting stage, one surface of the three-degree-of-freedom piezoelectric platform is provided with a piezoelectric ceramic actuator, and one end of the piezoelectric ceramic actuator is connected to an indenter; a clamp, wherein the clamp clamps a test piece, and the test piece faces the indenter; and an imaging module, wherein the imaging module comprises a microscope lens. The system can achieve in-situ micro-nano impact indentation test and rapid dot matrix indentation, and has higher indentation precision.

Rapid dot matrix micro-nano impact indentation testing system

Growing community of inventors

Changchun, China

Wei Zhang