Xilinx, Inc.

Wei-Yi Ku

Sholeh Diba

Napoleon W Lee

Derek R Curd

Neil G Jacobson

Kameswara K Rao

David Chiang

George H Simmons

Hy V Nguyen

Jeffrey H Seltzer

Thomas Y Ho

Robert W Barker

A clock enable control circuit for controlling flip flops on a programmable logic device. The clock enable control circuit either passes an original data signal to the input terminal of a flip flop, or feeds back an output signal from the output terminal to the input terminal of the flip flop in response to a clock enable control signal. The clock enable control signal is selected from one of a set control signal and a reset control signal that are otherwise provided on the programmable logic device to selectively control set and reset functions of the flip flop. In one embodiment, the set and reset control signals are generated as product-term signals that are programmably routed by a product-term allocator circuit to a macrocell including the flip flop and the clock enable control circuit.

Clock enable control circuit for flip flops

An overridable data protection mechanism for unlocking/locking a PLD includes a data protect override key register, an input key register, and a comparator. After the user inputs an access code to the input key register, the software program sends an enabling signal to the comparator which in turn compares the bits stored in the data protect override key register and the bits in the input key register. If the bits in the two registers are identical, then the comparator outputs a disable data protect signal, thereby allowing the user to modify the configuration data in that PLD. After an incremented version control number and the new configuration data are downloaded to the PLD, the program sends a disabling signal to the comparator, thereby preventing further modification to the configuration data on that PLD.

Overridable data protection mechanism for PLDs

A macrocell for a programmable logic device includes private product term assignments to provide various functions including set and reset, output enable, clocking, and inversion. Each of these additional functions is provided by assigning one of the product terms associated with the macrocell to perform one of these functions locally. By means of additional logic circuitry these functions are achieved either singly or in combination for a particular macrocell, thus improving macrocell flexibility and in some cases conserving pins of the chip of which the programmable logic array is a part.

High speed product term assignment for output enable, clock, inversion

A reconfigurable sense amplifier in accordance with the present invention operates in either a high switching speed mode, where power consumption is a less critical consideration, or in a low power consumption mode, where switching speed is a less critical consideration. In a high speed mode, the present invention provides an additional pull-up to an amplified bitline which in combination with an existing weak pull-up still permits the signal on the amplified bitline to be affected by a change in voltage on the bitline. In a low power mode, the present invention provides a temporary pull-up on the amplified bitline if a signal on a wordline is transitioning from high to low (i.e. indicating that a low-to-high signal transition may occur on the bitline). In this manner, the present invention anticipates that when such a transition occurs, the voltage on the amplified bitline may also increase. Thus, the present invention accelerates the low-to-high signal transition on the amplified bitline in the low power mode. If the signal on the wordline is either a constant high or low, then the additional pull-up is disabled, thereby conserving power during the low power mode. In a further aspect of the invention, a sense amplifier is provided for a cross-point interconnect matrix which avoids coupling noise by isolating the bitline from the access transistors using an EPROM cell.

Sense amplifier for programmable logic device having selectable power

In an EPLD, a feedback switching circuit is provided on a feedback line connected between a macrocell output line and a interconnect matrix wordline, the switching circuit including a memory element and a switch for passing a macrocell output signal from the output line to the interconnect matrix wordline when the memory element is in a first state, and for blocking the macrocell output signal when the memory element is in a second state. This prevents coupling noise in the interconnect matrix because unnecessary feedback signals are prevented from entering the interconnect matrix. In another embodiment, a method is provided in which unused macrocells produce counteractive switching signals in the interconnect matrix to reduce the coupling effect caused by a multiple concurrent switching event. In another embodiment, a sense amplifier is provided in which an EPROM shields coupling between wordlines and bitlines in an interconnect matrix.

Method and apparatus for reducing coupling switching noise in

A programmable logic array, where the programmable AND gate array in each block of macrocells conventionally generates a number of product terms to drive the macrocells in that block. Five product terms are assigned to each macrocell and are logically NORed together with two adjacent macrocell signals. The resultant signal drives the D terminal of the flip-flop in the macrocell. Independently, all five product terms are logically NORed together and the resultant signal is provided as an export signal to an adjacent macrocell for an additional product term use. Thirdly, each one of the product terms can be individually set as a separate private product term for use internally in that macrocell to replace the otherwise global provisions of internal macrocell signals such as set, reset, clock, output enable and inversion.

Macrocell architecture with high speed product terms

A wordline driver for a wordline in an integrated programmable logic device (PLD) having flash memory cells. The wordline driver includes an input terminal that accepts a binary wordline input signal, a pass gate coupled to the input terminal and to a mode-control terminal, and an inverter that receives an input from the pass gate or the mode-control terminal, depending on the operating mode of the PLD. The output signal from the inverter is coupled to a multiplexer that selects between that output and a signal from a voltage supply, the signal selected depending on the operating mode of the PLD. The multiplexer outputs the selected signal to the wordline of the PLD.

Wordline driver for flash PLD

A reconfigurable sense amplifier in accordance with the present invention operates in either a high switching speed mode, where power consumption is a less critical consideration, or in a low power consumption mode, where switching speed is a less critical consideration. In a high speed mode, the present invention provides an additional pull-up to an amplified bitline which in combination with an existing weak pull-up still permits the signal on the amplified bitline to be affected by a change in voltage on the bitline. In a low power mode, the present invention provides a temporary pull-up on the amplified bitline if a signal on a wordline is transitioning from high to low (i.e. indicating that a low-to-high signal transition may occur on the bitline). In this manner, the present invention anticipates that when such a transition occurs, the voltage on the amplified bitline may also increase. Thus, the present invention accelerates the low-to-high signal transition on the amplified bitline in the low power mode. If the signal on the wordline is either a constant high or low, then the additional pull-up is disabled, thereby conserving power during the low power mode.

Sense amplifier having selectable power and speed modes

The bit line for reading data in or writing data out from a CMOS integrated circuit latch is precharged to the trip point voltage of the latch (as determined by the latch's transistor design) shortly before the occurrence of a read operation. The precharging circuitry uses the latch circuit itself to generate the trip point, hence ensuring that the precharging circuit operates properly with regards to the latch characteristics in spite of temperature, voltage and fabrication process variations. The precharging circuitry ensures that during the operation of reading data from the latch, the bit line voltage never causes the latch to completely switch states, since at most the bit line voltage asymptotically approaches the trip point voltage. The precharging circuit is relatively simple, including only two logic gates and three other transistors.

Precharging bitlines for robust reading of latch data

More than one security bit is used in a block of a PLD chip. The internal configuration and other information is left unprotected when all the security bits are in the erased state, and is protected by programming one or all the security bits. The security bits are located physically in proximity to the areas containing configuration and any other user-defined data, both so that they are difficult to discover and so that the erasure of all security bits in a EPROM-based PLD would cause a large number of adjacent user-defined bits to be erased as well, hence making it very difficult to extract useful information from a protected device by reverse engineering. Situating security bits in a different, pseudorandom location within each block of the chip makes them difficult to find and so further inhibits reverse engineering.

Growing community of inventors

San Jose, CA, United States of America

Wei-Yi Ku