Average Co-Inventor Count = 6.20
ph-index = 5
The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.
Company Filing History:
1. Amo Wavefront Sciences, LLC (10 from 59 patents)
2. University of Texas System (4 from 5,444 patents)
3. Amo Development, LLC (2 from 331 patents)
16 patents:
1. 11912758 - Methods of treating metastasis, including inhibiting bone cancer metastasis, by administering an antibody which binds connexin 43 (Cx43) hemichannel
2. 11730359 - Optical imaging and measurement systems and methods for cataract surgery and treatment planning
3. 11498963 - Anti-LILRB antibodies and their use in detecting and treating cancer
4. 10889637 - Methods of treating an osteolytic tumor and spinal cord injury by administering connexin (Cx) 43 hemichannel-binding antibodies
5. 10631724 - Method and system for dynamically measuring tear film breakup and irregularity using corneal topography and wavefront aberrometry
6. 10583039 - Method and system for eye measurements and cataract surgery planning using vector function derived from prior surgeries
7. 10582846 - Method and system for eye measurements and cataract surgery planning using vector function derived from prior surgeries
8. 10582847 - Method and system for eye measurements and cataract surgery planning using vector function derived from prior surgeries
9. 10506923 - Optical imaging and measurement systems and methods for cataract surgery and treatment planning
10. 10501538 - Anti-LILRB antibodies and their use in detecting and treating cancer
11. 10456026 - Apparatus, system, and method for intraocular lens power calculation using a regression formula incorporating corneal spherical aberration
12. 9468369 - Model eye producing a speckle pattern having a reduced bright-to-dark ratio for use with optical measurement system for cataract diagnostics
13. 8622546 - Method of locating valid light spots for optical measurement and optical measurement instrument employing method of locating valid light spots
14. 8260024 - Systems and methods for measuring surface shape
15. 8126246 - Systems and methods for measuring surface shape