Realtek Semiconductor Inc.

Wei-Xiong He

Feng-Cheng Chang

Jun Yang

Jian Liu

Fei Xu

Xiao-Guo Zheng

Disclosed is a test system including a transmitter, a receiver, a measuring circuit, and a control circuit. The transmitter is coupled to the receiver in a DC coupling manner, and includes: a signal input circuit determining an output signal according to an input signal; a current source coupled between the signal input circuit and a low power-supply terminal and configured to determine a total current passing through the signal input circuit in a non-open/short-circuited condition; and a signal output wire circuit outputting the output signal for a performance test. The receiver includes: an impedance circuit coupled to the signal output wire circuit; and a coupling circuit coupling the impedance circuit with a high power-supply terminal. The measuring circuit measures a target current/voltage between the high power-supply terminal and low power-supply terminal to generate a measurement result. The control circuit determines whether the transmitter/receiver is open/short-circuited according to the measurement result.

Test system, transmitter, and receiver capable of executing multiple tests based on DC coupling configuration

A test system includes a transmitter, capacitor, and receiver. The transmitter includes: an output circuit coupled to the receiver via the capacitor; a transmitting circuit transmitting a predetermined signal to a pad of the output circuit during a first test; a signal generator outputting a first signal and second signal to the pad during a first process and second process of a second test; and a comparator comparing the pad's signal with a reference signal in the first process and second process to determine whether the second test passes. The receiver includes: an input circuit coupled to the transmitter via the capacitor; a switch coupled between the input circuit and a receiving circuit to be conducting in the first test and second process and nonconducting in the first process; and the receiving circuit determining whether the first test passes according to the predetermined signal and assisting the capacitor in discharging.

Test system, transmitting device, and receiving device capable of performing multiple tests in AC coupling mode

A gain modulation circuit includes a load circuit, a differential circuit, a current source, a resistor, a first transistor, and a detector circuit. The load circuit is configured to receive a supply voltage. The differential circuit is coupled to the load circuit. The differential circuit and the load circuit are configured to generate a pair of output voltages according to a pair of input voltages and the supply voltage. The current source is coupled to the differential circuit. The resistor is coupled to the differential circuit and the current source. The first transistor is coupled to the differential circuit. The detector circuit is configured to generate a detection signal according to the pair of input voltages. A turned-on degree of the first transistor is adjusted based on the detection signal, to adjust a linear region of the gain modulation circuit.

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Suzhou, China

Wei-Xiong He