Infineon Technologies Ag

Wei Wang

Mihail Jefremow

Juergen Schaefer

Rex Kho

Dietmar König

Ralph Mueller-Eschenbach

Arndt Voigtlaender

Michael Augustin

Josef Niederl

Holger Dienst

Jürgen Schäfer

Shane O'Neill

Lingyun Li

Soenke Ohls

According to various embodiments, a circuit for determining the frequency of a signal is described, comprising an input configured to receive an analog input signal, an analog to digital converter configured to convert the analog input signal to a digital input signal, a digital mixer configured to generate a mixing result signal by mixing the digital input signal with a single bit binary signal having a reference frequency, a low pass filter configured to generate a filtered signal by filtering the mixing result signal, a measuring circuit configured to measure the period of the filtered signal and an output configured to output a value differing from the frequency of the single bit binary signal by the inverse of the measured period as the frequency to be determined.

Circuit for determining the frequency of a signal

A device including at least one processor, and an analog-to-digital (ADC) circuit, wherein the at least one processor is configured to generate an excitation signal and provide the excitation signal to a crystal in a pierce oscillation configuration, wherein after providing the excitation signal, the ADC circuit is configured to obtain as input a signal output from the crystal and convert the signal to a digital output; the at least one processor is configured to compare the digital output of the ADC circuit to a plurality of thresholds and based on the comparisons is further configured to drive the crystal to cause the crystal to operate as a pierce oscillator and to generate a clock signal from at least of one of the comparisons.

Devices, systems, and methods for implementing a real time clock

Systems, methods, and circuits are provided for facilitating negative resistance margin testing in an oscillator circuit. An example oscillator circuit includes amplifier circuitry configured to be coupled in parallel with a resonator and variable resistance circuitry configured to, in response to a resistance control signal, adjust a resistance of the oscillator circuit.

Oscillator circuit with negative resistance margin testing

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Munich, Germany

Wei Wang