National Sun Yat-sen University of Kaohsiung

Noporvis Co., Ltd.

National Central University

Wei-Hung Su

Kuo-Kai Hung

Hui-Hung Lin

Chun-Neng Chan

Lu-Yu Wang

Bo-chin Huang

Ching-Cherng Sun

Yeh-Wei Yu

Guang-Hong Chen

Chau-Jern Cheng

A method for reconstructing a surface of an object includes the steps as follows. A light beam is modulated by a spatial light modulator (SLM) and is projected to form a pattern, wherein the pattern has a transmittance distribution in a cosine distribution such that the pattern is formed to become a fringe pattern with a periodic change. A first impulse and a second impulse present within a first period and a second period of the cosine distribution, wherein a position where the first impulse occurs within the first period and a position where the second impulse occurs within the second period are different. The light beam is guided to an object so as to form a scan pattern on the object. The scan pattern is read. According to the scan pattern, a surface profile of the object is calculated.

Method and optical system for reconstructing surface of object

A rotation angle measuring device includes a light source for generating a first light beam with a first polarization direction and a second light beam with a second polarization direction; a first beam splitter for splitting the first light beam and the second light beam to generate a third light beam and a fourth light beam; an image sensor for sensing a first interference pattern generated by the first and second light beams passing through a first displacement measurement module, and sensing a second interference pattern generated by the third and fourth light beams passing through a second displacement measurement module; and a processing unit for calculating two displacement values at two different positions on a measured object according to the first and second interference patterns, in order to further calculate a rotation angle of the rotation angle measuring device relative to the measured object along a first axis.

Rotation angle measuring system and machining system comprising the same

A system for measuring the profile or the refractive index of a transparent object by fringe projection techniques is provided and has an image generating device, an image capture device, and an image processor. The image generating device produces a reference image with a long depth of focus. This reference image is emitted into an inspected transparent object, and is distorted by the refractive index and the profile of the transparent object. The image capture device receives the distorted image. The image processor analyzes the difference between the distorted image and the reference image, so as to identify the profile or the refractive index of the inspected transparent object.

System for measuring three-dimensional profile of transparent object or refractive index by fringe projection

A displacement measuring device includes an optical module for refracting or reflecting light; a beam splitting module including a polarizing beam splitting layer for allowing light with a first polarization direction to pass through and reflecting light with a second polarization direction; a light source for generating a first light beam with the first polarization direction and a second light beam with the second polarization direction, wherein the first light beam is reflected by a measured object after passing through the optical module and the beam splitting module, and the second light beam is reflected by the polarizing beam splitting layer after passing through the optical module; an image sensor for sensing an interference pattern generated by the reflected first and second light beams; and a processing unit for calculating a displacement value of the measured object according to the interference pattern.

Displacement measuring system and machining system comprising the same

A topographical measurement system of a specular object and a topographical measurement method thereof are disclosed. The topographical measurement system has a screen, an image capturing device, and an image processing device. The specular object reflects a fringe pattern from the screen, so as to form a virtual image of the fringe pattern. The virtual image is therefore analyzed to obtain a surface profile of the specular object.

Topographical measurement system of specular object and topographical measurement method thereof

A method using fringe projection to describe the three-dimensional profile of a specular object is presented and has steps of: providing a diffraction grating formed by exposing and developing a hologram and having at least two sets of interference fringes; guiding a conjugate of the reference light generated from a conjugate light source to pass through the diffraction grating, in order to generate a real image with a long depth of field, a wide convergent angle, and a sinusoidal distribution light intensity; projecting this real image onto an inspected specular object; using an image capture device to capture the intensity distribution of the real image on the inspected specular object so as to obtain an image signal; and using an image processor to analyze the image signal so as to identify the profile of the inspected specular object.

Growing community of inventors

Kaohsiung, Taiwan

Wei-Hung Su