Changxin Memory Technologies, Inc.

Microsoft Technology Licensing, LLC

Wei Huang

Jun Xu

Yuan Kong

Xiaodong Luo

Hai Ming

Tianpeng Zhao

Jianping Xie

Huaqiao Gui

Chi-Shian Wu

The present application relates to the technical field of integrated circuits, and in particular, to a memory test method and a memory test apparatus. The memory test method includes: providing a to-be-tested memory, where the to-be-tested memory includes a plurality of memory cells; alternately writing a first write value and a second write value into a memory cell of the memory cells at a preset frequency; writing a test write value into the memory cell; judging whether a data read from the memory cell is the test write value, and determining that a capacitance-frequency characteristic of the memory cell is abnormal if the data is not the test write value. According to the present application, the capacitance-frequency characteristic of the to-be-tested memory is accurately tested, to improve the field of memory products.

Memory test method and memory test apparatus

A method for manufacturing a semiconductor device, including: acquiring a substrate, wherein a gate structure is formed on the substrate; implanting first ions into the substrate to form pre-amorphized regions at two sides of the gate structure respectively; implanting second ions into the pre-amorphized regions to form amorphized regions in the pre-amorphized regions respectively; forming first sidewalls each at a respective one of the two sides of the gate structure; performing a second doping process to form first doped regions in the amorphized regions; forming second sidewalls each at a side of a respective first sidewall; and forming a heavily-doped source region and a heavily-doped drain region in the first doped regions respectively.

Method for manufacturing semiconductor device

A computer input device includes a light source assembly forming an incident light beam that strikes an area on a surface beneath the input device with large incident angle. A light sensing assembly in the input device is positioned to receive scattered light and includes a band-pass filter. A barrier is located directly above the area where the light beam is incident on the top surface to prevent light from traveling directly from the light source assembly to the light sensing assembly.

Pointing device with optical positioning on low-diffusive surfaces

Growing community of inventors

Hefei, China

Wei Huang