Corning Applied Technologies Corporation

Wei Hu

Yi-Qun Li

Feiling Wang

Hua Jiang

Yingyin Kevin Zou

Xiao-Li Li

Shaohua Liang

Jiankang Huang

Vladimir Fuflyigin

A polarization mode dispersion center ( ) measures PMD impairment through the cross-correlation of optical pulses. A second variable phase retarder plate ( ) is oriented with polarization eigenstates at preferably 45 degree angle with respect to those eigenstates of a first variable phase retarder plate ( ) to provide controllable phase retardations that can be varied and measured as an indication of PMD impairment.

Cross-correlating PMD detector

A ferroelectric layer is deposited or in close proximity to a ferromagnetic ferrite layer to make a microwave substrate on which conductors can be deposited or placed to make devices. The permittivity of the ferroelectric layer can be changed by applying a voltage and the permeability of the ferromagnetic layer can be changed with a magnetic field. This makes it possible to tune the device characteristics with two different effects taking best advantage of the capabilities of each. A material example is ferromagnetic yttrium-iron-garnet on which is deposited a thin film of ferroelectric barium strontium titanate. To minimize losses, the ferroelectric film should be high quality, but practical yttrium-iron-garnet substrates are polycrystalline so that the use of buffer layers is desirable. At least two methods can be used to deposit the ferroelectric film, pulsed laser deposition and metal-organic chemical liquid deposition. A variety of dual tunable microwave devices can be made with this substrate, including by way of example only, phase shifters, frequency filters, and resonators.

Dual-tuning microwave devices using ferroelectric/ferrite layers

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Plainsboro, NJ, United States of America

Wei Hu