Radiant Opto-electronics Corporation

Mpi Corporation

Radiant Opto-electronics (suzhou) Co., Ltd.

Wei Hsuan Chen

Wei-Cheng Ku

Jun-Liang Lai

Chun-Chung Huang

Kuang-Chung Chou

Hsin Hsiang Liu

Hsin-Hsiang Liu

Kuang Chung Chou

Yung Hui Tai

Chan Hung Huang

A prism sheet includes a sheet body that includes opposite light exiting and incident surfaces, and a lateral side transversely connected between the light incident and exiting surfaces. The light exiting surface includes two side regions disposed on two opposite sides of a reference line on the light exiting surface, which is perpendicular to the lateral side. The sheet body further includes a plurality of parallel microstructure members protruding from the light exiting surface and extending perpendicularly to the lateral side. The microstructure members have a distribution density decreased in a density-decreasing direction parallel to the lateral side and pointing toward either of the side regions from the reference line.

Prism sheet, and a backlight module and a display apparatus including the same

A probe module, which supports loopback test and is provided between a PCB and a DUT, includes a substrate, a probe base, two probes, two signal path switchers, and a capacitor. The substrate has two first connecting circuits and two second connecting circuits, wherein an end of each first connecting circuit is connected to the PCB. The probe base is provided between the substrate and the DUT with the probes provided thereon, wherein an end of each probe is exposed and electrically connected to one second connecting circuit, while another end thereof is also exposed to contact the DUT. Each signal path switcher is provided on the probe base, and respectively electrically connected to another end of one first and one second connecting circuits. The capacitor is provided on the probe base with two ends electrically connected to the two signal path switchers.

Probe module supporting loopback test

A probe card, which is between a tester and a device under test (DUT), includes two first electrical lines, two second electrical lines, two inductive elements, and a capacitor. The first electrical lines are electrically connected to the probes respectively. The second electrical lines are electrically connected to the first electrical lines respectively. The inductive elements are electrically connected to the first electrical lines and the tester respectively; and the capacitor has opposite ends connected to the second electrical lines respectively.

Signal path switch and probe card having the signal path switch

A backlight module is provided herein, which mainly contains a casing, a light mixing plate, a diffusion plate, a number of LEDs and optical sheets. The LEDs are positioned along the light incidence planes at the sides of the light mixing plate. The casing is positioned in front of the light mixing plate with the diffusion plate at the back opening of the light mixing plate. The optical sheets are placed in turn behind the diffusion plate. As such, the thickness of the backlight module is reduced significantly.

Light mixing backlight module

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Kaohsiung, Taiwan

Wei Hsuan Chen