Mediatek Corporation

Wei-Hsiang Tseng

Hsin-Cheng Chen

Ping-Sheng Chen

Shih-Ta Hung

A weighted defect estimating apparatus and a related method for determining a defect estimation value are disclosed. The weighted defect detecting apparatus includes: a defect detecting unit for generating a defect value when a defect in a predetermined region of an optical disc is detected; a weighting circuit, electrically connected to the defect detecting unit, to generate a weighted defect value according to the defect value and a weighting factor corresponding to a location of the defect on the optical disc; and a computing module, electrically connected to the weighting circuit, for computing the defect estimation value according to a plurality of weighted defect values corresponding to the predetermined region.

Defect estimation apparatus and related method

An EFM/EFM+ encoder and a method thereof, performing digital sum value (DSV) protection in an Eight-to-Fourteen/Eight-to-Fourteen Plus (EFM/EFM+) encoding system to generate a data frame to be recorded on a recording medium. The method comprises modulating source data to the data frame having a predetermined number of channel bits, determining merging bits and DSV based on the channel bits, and changing the predetermined number of the channel bits in the data frame based on the DSV and the merging bits. The changing the predetermined number of the channel bits comprises inserting or removing a channel bit at the end of the data frame.

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Taipei, Taiwan

Wei-Hsiang Tseng