Taiwan Semiconductor Manufacturing Comp. Ltd.

Accton Technology Corporation

Wei-Hsiang Huang

Chui-Ya Peng

Sen-Yeo Peng

Jia-Rong Xiao

Chia-Wei Liu

Chung-Chuan Tseng

Li Hsin Chu

A system includes a cooler, a concentration meter, a first pump and a second pump. The cooler is configured to cool first liquid by second liquid in the cooler. The concentration meter is configured to measure a concentration of the first liquid. The first pump is configured to move the first liquid according to the concentration. The second pump is coupled to the cooler, disposed with the first pump in a parallel manner, and configured to move the second liquid.

System and method for operating the same

A system includes a cleaning device and a concentration measuring device. The cleaning device includes a first pipe and a first pump. The first pump is configured to move first liquid in the first pipe. Two terminals of the first pump are respectively coupled to the first pipe. The concentration measuring device includes a tube, a cooler, a concentration meter and a second pump. The tube is coupled to the first pipe, and is configured to retrieve the first liquid. The cooler covers the tube to cool the first liquid. The concentration meter is configured to measure a concentration of the first liquid cooled by the cooler. The second pump is coupled to the tube, and is configured to move the first liquid according to the concentration.

A system is disclosed herein. The system includes a tank, a tube, a cooler, and a concentration meter. The tank is configured to contain first liquid. The tube is coupled to the tank and configured to convey the first liquid from the tank. The cooler covers the tube to cool the first liquid conveyed by the tube. The concentration meter is configured to measure a concentration of the first liquid cooled by the cooler.

A wafer includes a first set of dies and a second set of dies. The wafer further includes a scribe line separating the first set of dies from the second set of dies, wherein the scribe line has a first width. The wafer further includes a plurality of trenches between adjacent dies of the first set of dies and connected to the scribe line, wherein the plurality of trenches has a second width less than the first width, and a depth of each trench of the plurality of trenches is less than a thickness of the wafer.

Partitioned wafer and semiconductor die

A method of partitioning a wafer includes defining a scribe line surrounding a set of dies. The method further includes etching a plurality of trenches into the wafer, wherein each trench of the plurality of trenches is located between adjacent dies of the set of dies, and a width of each trench of the plurality of trenches is less than a width of the scribe line. The method further includes thinning the wafer to expose a bottom surface of the plurality of trenches. The method further includes cutting along the scribe line to separate the set of dies from another portion of the wafer.

Wafer partitioning method and device formed

A network switch system includes a Power-over-Ethernet (PoE) controller, a power sourcing equipment (PSE) controller, and a host computer. The PoE controller is electrically connected to the PSE controller, and stores a loader and a firmware image. The host computer is connected to the PoE controller and stores a second firmware image. The host computer switches the PoE controller to a firmware upgrade mode when the second firmware image is newer than the firmware image. The PoE controller executes the loader in the firmware upgrade mode and overwrites the firmware image with the second firmware image downloaded from the host computer. The PoE controller checks data integrity of the firmware image with an error detection and correction code included in the firmware image, and restarts if no error is found in the firmware image.

Network switch system and operating method thereof

A power supply method includes providing a plurality of output powers to a plurality of power devices (PDs); acquiring a plurality of power statuses of the PDs (power devices); calculating a summation of the output powers provided to the PDs (power devices); determining whether the summation of the output powers exceeds a predetermined threshold; and under a condition that the summation of the output powers exceeds the predetermined threshold, adjusting the output powers provided to the PDs (power devices) based upon the power statuses of the PDs (power devices).

Growing community of inventors

Hsinchu, Taiwan

Wei-Hsiang Huang