Bae Systems Information and Electronic Systems Integration Inc.

Wayne Neiderer

Nadim F Haddad

Neil Edward Wood

Scott Doyle

Adam Matthew Bumgarner

Shankarnarayana Ramaswamy

Tri-Minh Hoang

A method for connecting circuit elements within an integrated circuit for reducing single-event upsets is disclosed. The integrated circuit includes a first and second circuit elements that are substantially identical to each other. In order to reduce the single-event upsets to the first and second circuit elements, each of the first and second circuit elements is divided into a first sub-element and a second sub-element. The first sub-element of the first circuit element is connected to the second sub-element of the second circuit element. The second sub-element of the first circuit element is connected to the first sub-element of the second circuit element. As a result, the nodal spacings between the sub-elements within the first and second circuit elements are effectively increased without demanding additional real estate.

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Manassas, VA, United States of America

Wayne Neiderer