Hewlett-packard Development Company, L.p.

Intel Corporation

Wayne C Ashby

Dean T Lindsay

Abhimanyu Kolla

Adarsh Panikkar

David A Plettner

A method is described that involves loading X bits at a time into a shift register and shifting groups of older, loaded X bits up in the shift register with each new group of loaded X bits. Each group of X bits has been received from a serial data stream. The method further involves identifying an alignment key within the shift register and presenting aligned data from the serial data stream by rotating selection of a first group of Y contiguous bits from the shift register and a second group of Y contiguous bits from the shift register after the identifying. Y is greater than X.

Non-integer word size translation through rotation of different buffer alignment channels

The present invention is a device and method to change the reflection time of a bidirectional signal so as to cause a false data value to be correctly seen as the proper data value when the bidirectional signal travels between a first semiconductor chip and a second semiconductor chip, through a transmission line between the two semiconductor chips. The reflection time is adjusted by coupling an electrical network to the transmission line to cause an early electrical reflection. In one embodiment, the network is coupled to establish an impedance discontinuity between the board trace and the package trace.

Device and method to cause a false data value to be correctly seen as the proper data value

A test fixture is disclosed for applying force to the surface of a printed circuit board to maintain proper electrical contact between the printed circuit board and an IC package or other electrical component on the opposite side of the board. The fixture employs a link structure to apply force to the board surface while still allowing access to contact points of interest on the side of the board opposite the IC package.

Back pressure test fixture to allow probing of integrated circuit package signals

Disclosed is a method and device for creating probe masks. In one embodiment, the mask aids in locating and accessing a pad on a PCB to allow for the measurement a signal at the pad using a probe. The mask is a perforated insulating sheet having holes corresponding to the spacing of at least some of the conductive pads on the PCB, and at least some of the holes are marked to aid in signal measurement. A processing system is used to assist in creating the markings.

System and method for creating probe masks

A driving integrated circuit in electrical connection with a first printed circuit board. A memory device is in electrical connection with a receiving integrated circuit, which is electrically connected with a second printed circuit board. The driving integrated circuit and the memory device each include a data port and a clock port. A data line electrically connects the first port of the printed circuit board with the first port of the second printed circuit board for transmitting a data signal. A clock line electrically connects the second port of the first printed circuit board with the second port of the second printed circuit board for transmitting a clock signal associated with the data signal. The clock line has a length greater than a length of the data line such that a time delay is introduced into the clock signal passing from the driving integrated circuit to the receiving integrated circuit.

Growing community of inventors

San Jose, CA, United States of America

Wayne C Ashby