Advanced Micro Devices Corporation

University of Massachusetts

Intel Corporation

Wayne Burleson

Greg Sadowski

Shubhendu Sekhar Mukherjee

Vikram B Suresh

Srilatha Manne

Shomit N Das

Atul Maheshwari

Steven E Raasch

Mark Buckler

Vinod Ambrose

Daniel E Holcomb

Vishak Venkotroman

A conversion unit converts operands from a conventional number system that represents each binary number in the operands as one bit to redundant number system (RNS) operands that represent each binary number as a plurality of bits. An arithmetic logic unit performs an arithmetic operation on the RNS operands in a direction from a most significant bit (MSB) to a least significant bit (LSB). The arithmetic logic unit stops performing the arithmetic operation prior to performing the arithmetic operation on a target binary number indicated by a dynamic precision associated with the RNS operands. In some cases, a power supply provides power to bit slices in the arithmetic logic unit and a clock signal generator provides clock signals to the bit slices. Gate logic is configured to gate the power or the clock signals provided to a subset of the bit slices.

Dynamic variable precision computation

A system and method for managing operating parameters within a system for optimal power and reliability are described. A device includes a functional unit and a corresponding reliability evaluator. The functional unit provides reliability information to one or more reliability monitors, which translate the information to reliability values. The reliability evaluator determines an overall reliability level for the system based on the reliability values. The reliability monitor compares the actual usage values and the expected usage values. When system has maintained a relatively high level of reliability for a given time interval, the reliability evaluator sends an indication to update operating parameters to reduce reliability of the system, which also reduces power consumption for the system.

System and method for energy reduction based on history of reliability of a system

A circuit includes a plurality of synchronizers to adapt a signal from a first clock domain to a second clock domain. Each synchronizer of the plurality of synchronizers includes a synchronizer input to receive the signal from the first clock domain and a synchronizer output to provide the signal as adapted to the second clock domain. The circuit also includes a multiplexer (mux) that includes a plurality of mux inputs and a mux output. Each mux input is coupled to the synchronizer output of a respective synchronizer of the plurality of synchronizers. The mux output provides the signal, as adapted to the second clock domain, from the synchronizer output of a selected synchronizer of the plurality of synchronizers.

Methods and systems of synchronizer selection

A mechanism is provided for a circuit for generation of a random output. A bistable circuit has two stable states as an output and a clock signal as an input. The bistable circuit includes a first logic circuit and a second logic circuit cross-coupled connected together, which transition into a metastable state before resolving to the two stable states. The second logic circuit resolves to a stable state at a resolution time. A digitization circuit is configured to generate random bits corresponding to a variance of the resolution time of the second logic circuit resolving from the metastable state to the stable state for cycles of the clock signal. The resolution time randomly varies according to noise. An actual value of the stable state is eliminated as factor in generating the random bits.

Generate random numbers using metastability resolution time

A memory element which includes a family of fault-tolerant storage elements using complementary metal-oxide-semiconductor (CMOS) technology is provided. The memory element provides arbitrary levels of redundancy, allowing the tolerance of multiple single event upsets due to particle hits. The memory element may be used in memory arrays such as caches and register files, and clocked registers and latches found in data path and control structures.

Generalized interlocked register cell (GICE)

Returning to FIG.sense circuitrepresents the circuit that must sense the signaling on an interconnect. NMOS deviceis always on so that there is a continuous path to ground whenever PMOS driveris on. Since leakage power is an order of magnitude less than static and dynamic power it can be omitted for clarity, although it should be noted that dynamic power increases with respect to line length since the interconnect capacitance increases as line length increases. Static power is due to flow of static current across the two resistances shown in FIG.interconnect resistanceand the resistance of transistorsandfrom FIG.represented by the resistance of equivalent NMOS transistorof FIG.

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Shutesbury, MA, United States of America

Wayne Burleson