Fuji Electric Co., Ltd.

Wataru Tomita

Hitoshi Sumida

Masaru Saito

Masahiro Sasaki

Akira Nakamori

Takahiro Mori

Osamu Sasaki

To provide a semiconductor integrated device capable of a gate screening test with no need for any additional circuit and without adding any gate screening terminal. The semiconductor integrated device includes a gate drive unit configured to drive the gate of a voltage controlled semiconductor element and a regulator configured to supply a gate drive voltage to the gate drive unit. The regulator includes an external connection terminal capable of receiving a gate screening voltage for the voltage controlled semiconductor element in a gate screening test.

Semiconductor integrated device and gate screening test method of the same

A multiphase driver device includes: one phase driver circuit of a first type including a first monitoring transistor and a first monitoring resistor generating a first voltage that is proportional to a first source current supplied to a one of the plurality of semiconductor switches; and a plurality of phase driver circuits of a second type each including a second monitoring transistor and a second monitoring resistor generating a second voltage that is proportional to that a second source current supplied to corresponding one of the remaining semiconductor switches, each of the plurality of phase driver circuits of the second type further including a comparator that compares the second voltage to the reference voltage, and a first regulating transistor that adds a first regulating current to the second source current in accordance with an output of the comparator.

Multiphase driver device and three-phase driver device

Growing community of inventors

Matsumoto, Japan

Wataru Tomita