Matsushita Electric Industrial Co., Ltd.

Wataru Itoh

Toru Iwata

Osamu Shibata

Yoshiyuki Saito

Satoshi Takahashi

Akihiko Watanabe

Takeru Yamashita

Tomohiko Kanemitsu

An assembly for an LSI test supplies a test signal output from an LSI tester to a target LSI to be tested and outputs, to the LSI tester, a test result signal generated by processing of the target LSI performed in accordance with the test signal. The assembly for an LSI test includes: a peripheral circuit coupled to the target LSI and allowing the target LSI to operate in the same manner as in the application environment; and a printed circuit board on which the peripheral circuit is mounted.

Assembly for LSI test and method for the test

First and second transmission lines and are connected to each other in series. A first terminator is connected to the first transmission line in parallel, and is provided externally of a semiconductor device. A second terminator is connected to the second transmission line in parallel, and is provided inside the semiconductor device. The values of the first and second terminator are adjusted so that the combined resistance value of first and second terminator and the second transmission line matches with the impedance of the first transmission line. Impedance matching of the entire transmission line can be achieved with this simple construction, thus, a stable, high quality signal can be transmitted.

Signal receiving circuit

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Kyoto, Japan

Wataru Itoh