Universiteit Hasselt

Imec

Imec Vzw

Limburgs Universitair Centrum

Interuniversitair Microelektronica Centrum (imec)

Interuniversitair Micorelektronica Centrum (imec, Vzw)

Limburgs Universitaire Campus

Interuniversitair Micro-elektronic Centrum Vzw

Interuniversitair Micro-electronika Centrum Vzw

Ward Aime De Ceuninck

Patrick Wagner

Luc Irena De Schepper

Jean Joseph Roggen

Bart Van Grinsven

Lambert Mathias Stals

Mehran Khorshid

Ronald Thoelen

Luc Michiels

Derick Yongabi

Jaroslav Hruby

Jan Van Olmen

Patricia Losada-Pérez

Emilie Bourgeois

Alessandro Goldoni

Milos Nesladek

The present disclosure relates to a method for characterizing and identifying a bioparticle. The method comprises introducing the sample to a substrate having a surface comprising a plurality of binding sites whereon bioparticles can be bound, determining, for at least one temperature, data representative for the interface thermal resistance of the surface of the substrate sufficiently long to include the detachment process of the bioparticles, and deriving, for the at least one temperature, a bioparticle retention time and/or detachment rate from the data representative for the interface thermal resistance data. The present disclosure also relates to a bio-sensing device suitable for the detection and/or characterization of target bioparticles.

Bioparticle characterization and identification using interface thermal resistance measurement during bioparticle adhesion and detachment

The disclosure relates to a magnetometer sensor with negatively charged nitrogen-vacancy centers in diamond. One example embodiment is a magnetometer sensor. The magnetometer sensor includes a diamond crystal with one or more negatively charged nitrogen-vacancy centers. The magnetometer sensor also includes one or more light sources. Further, the magnetometer sensor includes an electrode. In addition, the magnetometer sensor includes a read-out module. The read-out module includes a read-out circuit configured to read-out a photocurrent from the electrode and a lock-in amplifier. The lock-in amplifier includes a first input, a second input, and an output. The magnetometer sensor additionally includes a microwave source configured to apply a microwave field to the negatively charged nitrogen-vacancy centers. The microwave source includes a microwave generator for generating continuous wave microwaves and a microwave modulator configured to modulate the continuous wave microwaves. Still further, the magnetometer sensor includes a processor.

Magnetometer sensor with negatively charged nitrogen-vacancy centers in diamond

A method an system is disclosed for the detection and/or allocation of at least one point mutation in target DNA and/or RNA duplexes. The method comprises obtaining a functionalized surface which is coated with probe DNA and/or RNA whereto target DNA and/or RNA duplexes are attached, contacting said functionalized surface to an electrolytic solution having a neutral pH in a flow cell and measuring a first impedance value within said electrolytic solution, and then adding a chemical to the electrolytic solution which is able to achieve denaturation of the target DNA and/or RNA. The method further comprises measuring a second impedance value within the flow cell after completion of the denaturation of the DNA and/or RNA target, and then obtaining a value representative for the impact of the chemical on the impedance of the electrolytic solution. The amount and/or allocation of point mutation(s) within the target DNA and/or RNA is then determined by calculating the denaturation-time constant based on the difference between the first and second impedance value and taking into account the impact of the chemical by third impedance value.

Biosensor using impedimetric real-time monitoring

A method an system is disclosed for characterizing DNA and/or RNA duplexes. The biosensing device comprises a heating element using a power and being suitable for providing thermal denaturation of target DNA and/or RNA bioparticles, a sample holder adapted for receiving a biocompatible substrate having a functionalized surface which is coated with probe DNA and/or RNA whereto target DNA and/or RNA duplexes can be attached, the sample holder further being adapted for exposing the biocompatible substrate at one side to the heating element, a first temperature sensing element for sensing a temperature at the side where the biocompatible substrate can be exposed to the heating element and a second temperature sensing element for sensing a temperature at the side opposite thereto with respect to the biocompatible substrate. The device also comprises a processing means programmed for calculating at least one heat transfer resistivity value based on temperature values obtained with the first temperature sensing element and the second temperature sensing element and the power for the heating element, for deriving a characteristic of the target DNA and/or RNA bioparticles from said heat transfer resistivity value.

Heat-transfer resistance based analysis bioparticles

The present disclosure is related to a method for determining time to failure characteristics of a microelectronics device. A test structure, being a parallel connection of a plurality of such on-chip interconnects, is provided. Measurements are performed on the test structure under test conditions for current density and temperature. The test structure is arranged such that failure of one of the on-chip interconnects within the parallel connection changes the test conditions for at least one of the other individual on-chip interconnects of the parallel connection. From these measurements, time to failure characteristics are determined, whereby the change in the test conditions is compensated for.

Method for determining time to failure of submicron metal interconnects

The invention relates to an N-bit digital-to-analogue converter (DAC) system, comprising&#x2014;a DAC unit comprising an N-bit master DAC and a slave DAC, yielding a master DAC unit output signal and a slave DAC unit output signal, respectively, said N-bit master DAC having an output step size,&#x2014;an adder unit combining the master DAC unit output signal and the slave DAC unit output signal, and&#x2014;a means for storing correction values for at least the master DAC, said correction values being used by the slave DAC, whereby the DAC system is arranged for master DAC output corrections with a size in absolute value higher than half of the output step size.

Digital-to-analogue converter system with increased performance

A method for measuring resistance changes is described to study electromigration induced failures in conductive patterns. This method can provide a basis for lifetime predictions based on low value failure criteria, i.e. small resistance changes in the conductive patterns in a limited period of time. Two essentially identical so-called test and reference structures are placed close to each other on the same substrate and submitted to at least one sequence of a stress period and a measurement period. During a stress period, a DC current with a high current density is applied to the test structure thereby enhancing electromigration, while substantially simultaneous an AC current is applied to the reference structure leading to the same amount of power dissipation in said reference structure as the amount of power dissipation in said test structure, introduced by said DC stress current. The method of the present invention makes it possible to distinguish in a very accurate way between resistance changes induced by electromigration and resistance changes induced by other disturbances.

Method for measuring electromigration-induced resistance changes

An apparatus and method for measuring a parameter of a sample or component at a measurement temperature, wherein the parameter and the measurement temperature are measured at substantially the same time. A temperature coefficient of the sample or component is also established by using temperature fluctuations measured at or near the sample at the time at which the parameter is measured. The temperature coefficient is used to correct the measured parameter data and enhance its stability.

Method and apparatus for local temperature sensing for use in performing

Method for local temperature sensing for use in performing high

An apparatus and method for determining the reliability of an electronic component by performing measurements which enable the ageing behavior of a parameter of that component to be predicted over time. The parameter measurements are made in-situ within the oven or environment used to control the temperature at which the measurements are made. The oven is controlled so that its temperature is kept stable, thereby permitting very high resolution measurements to be made over a relatively short time span. The temperature stability of the oven ensures that the changes of the electromagnetic parameter to be measured as a result of temperature fluctuations are negligible relative to the changes as a result of the ageing phenomena which occur in the component over time. The high resolution measurements are then used to model the parameter value as a function of time based on a deterministic model of how that parameter of the component varies over the lifetime of the component. The model is extrapolated over time to determine the reliability of the component as it ages. The result of the invention is a reliable prediction of the component's parameter value as a function of time, which enables a user or manufacturer to know when the parameter value will exceed its intended tolerance values, and either fail or cause the device in which it is incorporated to become unreliable.

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Avelgem, Belgium

Ward Aime De Ceuninck