The General Hospital Corporation

Enablence Holdings LLC

Wang-Yuhl Oh

Guillermo J Tearney

Brett Eugene Bouma

Benjamin J Vakoc

Dvir Yelin

Desmond Rodney Lim

Kevin Kidoo Lee

Christian Hoepfner

Seok-Hyun Yun

Johannes Fitzgerald De Boer

Seok-Yun Yun

Boumy Sayavong

An apparatus and source arrangement for filtering an electromagnetic radiation can be provided which may include at least one spectral separating arrangement configured to physically separate one or more components of the electromagnetic radiation based on a frequency of the electromagnetic radiation. The apparatus and source arrangement may also have at least one continuously rotating optical arrangement which is configured to receive at least one signal that is associated with the one or more components. Further, the apparatus and source arrangement can include at least one beam selecting arrangement configured to receive the signal.

Process and apparatus for a wavelength tuning source

Exemplary embodiments of apparatus, source arrangement and method for, e.g., providing high-speed wavelength tuning can be provided. According to one exemplary embodiment, at least one arrangement can be provided which is configured to emit an electromagnetic radiation that (i) has a spectrum whose mean frequency changes at an absolute rate that is greater than about 6000 (or 2000) terahertz per millisecond, (ii) whose mean frequency changes over a range that is greater than about 10 terahertz, and/or (iii) has an instantaneous line width that is less than about 15 gigahertz. According to another exemplary embodiment, at least one arrangement can be provided configured to, periodically and as a function of time, select at least one first electro-magnetic radiation based on a mean frequency of the at least one first electro-magnetic radiation, with the periodic selection being performed at a first characteristic period. The mean frequency can vary linearly over time, wherein the apparatus can emit at least one second electromagnetic radiation that has a spectrum whose mean frequency changes periodically as a function of time with a second characteristic period. Further, the first characteristic period can be greater than the second characteristic period.

Apparatus and method for utilization of a high-speed optical wavelength tuning source

Method and apparatus according to an exemplary embodiment of the present invention can be provided. For example, first data associated with a first signal received from at least one region of at least one sample can be provided based on a first modality, and second data associated with a second signal received from the at least one sample can be provided based on a second modality which is different from the first modality. Third data associated with a reference can be received. Further data can be generated based on the first, second and third data. In addition, third data associated with a second signal received from the at least one sample can be obtained. Each of the third data can be based on a further modality which is different from the first modality and the second modality, and the further data can be further determined based on the third data. Further, the first modality can be a spectral-encoded modality, and the second modality can be a non-spectral-encoding modality.

Arrangements and methods for providing multimodality microscopic imaging of one or more biological structures

An apparatus and source arrangement for filtering an electromagnetic radiation can be provided which may include at least one spectral separating arrangement configured to physically separate one or more components of the electromagnetic radiation based on a frequency of the electromagnetic radiation. The apparatus and source arrangement may also have at least one continuously rotating optical arrangement, e.g., polygonal scanning mirror and spinning reflector disk scanner, which is configured to receive at least one signal that is associated with the one or more components. Further, the apparatus and source arrangement can include at least one beam selecting arrangement configured to receive the signal.

Wavelength tuning source based on a rotatable reflector

A method for testing an optical chip, while the optical chip is still on a wafer, utilizing an optical probe, includes the steps of creating an access point on the wafer adjacent the optical chip. The optical chip having a waveguide having an axis. A portion of the waveguide is removed to form the access point such that light exiting the planar optical waveguide is directed in a direction substantially different from the axis of the waveguide. An optical probe is placed along a propagation path of the exiting light to optically couple the optical probe and optical chip.

Method and apparatus for on-wafer testing of an individual optical chip

A method for testing an optical chip, while the optical chip is still on a wafer, utilizing an optical probe, includes the steps of creating an access point on the wafer adjacent the optical chip. Inserting a probe at the access point to optically couple the optical probe and optical chip. The optical probe includes at least a first optical waveguide for changing the direction of input light at the probe to optically couple with the optical chip at the access point.

Growing community of inventors

Cambridge, MA, United States of America

Wang-Yuhl Oh