Skf Condition Monitoring Inc.

Wane D Wier

Johannes Izak Boerhout

Phillip L Maness

Hoa Nguyen

A method and system for monitoring the operational condition of a machine is disclosed. The system includes: a test probe configured to be coupled to the machine for measuring an operational parameter of the machine and for outputting a test signal representative of the measured operational parameter; a fault condition detection circuit, coupled to the test probe, for receiving and processing the test signal so as to detect a fault condition of the machine; a probe failure detection circuit, coupled to the test probe, for receiving the test signal and detecting a failure condition of the test probe if the test signal is not within defined limits, wherein the probe failure detection circuit provides a data path that is separate from the fault condition detection circuit; and a processor, coupled to the fault condition detection circuit and the probe failure detection circuit, for initiating a defined action in response to signals received from the fault condition detection circuit and the probe failure detection circuit. The method includes the following acts: measuring an operational parameter of the machine with a probe coupled to the machine; outputting a test signal representative of the measured operational parameter; providing the test signal to a machine fault detection circuit for processing; determining whether the test signal indicates that a machine fault condition exists; providing the test signal to a probe failure detection circuit; determining whether the test signal indicates a probe failure condition exists, wherein the probe failure detection circuit operates independently of the machine fault detection circuit; and initiating a defined action if it is determined that a machine fault condition exists and a probe failure condition is not detected.

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San Diego, CA, United States of America

Wane D Wier