Mirae Corporation

Wan Gu Le

Sang Soo Lee

Jong Won Kim

Hee Soo Kim

Young Hak Oh

Dong Chun Lee

A module IC handler used for testing module Ics is disclosed in which the handler enables loading and unloading operations for module ICs, without further elevating pallet over an installation plate, and provides sequential transferring operations for the pallet on which test or customer tray is placed. To this end, after all module Ics are loaded from the test tray exposed to the loading or unloading position or by the loading and unloading elevator units , or the test-finished module Ics are filled in the customer tray , the pallet is moved to a rotation position by a transfer , and then can be circulated to an upper side of the loading or unloading elevation plate by the downer

Growing community of inventors

Choongchungnam-do, South Korea

Wan Gu Le