United Microelectronics Corp.

Walx Fang

Charlie Han

A method for determining failure rate and selecting a best burn-in time is disclosed. The method comprises the following steps. First of all, integrate circuits are provided. Then a life-time testing process is performed, wherein a failure rate versus testing time relation is established by measuring the life-time of each integrated circuit under a testing environment, wherein an acceleration factor function also is established under the testing environment. Next a simulating process that uses a testing time function is performed to simulate the failure rate versus testing time relation. Then a transforming process that uses the acceleration factor function is performed to transform the testing time function into a real time function. Finally, an integrating process is performed to integrate the real time function through a calculating region to acquire an accumulated failure rate real time function.

Method for determining failure rate and selecting best burn-in time

An alternate-timing burn-in method suitable for testing a plurality of memory units on a wafer and capable of preventing any idling due to direct current timing. A first bit line voltage clocking signal is generated and sent to one terminal of any memory unit. A second bit line voltage clocking signal is generated and sent to the other terminal of the same memory unit. In addition, the edge of the second bit line voltage clocking signal corresponds to the mid-point of the first bit line voltage clocking signal.

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Kaohsiung, Taiwan

Walx Fang