Landis & Gyr Betriebs Ag

Walter Trachslin

Gregor Antes

Radivoje Popovic

Thomas Seitz

Beat Halg

A security element for the authentication of a substrate has a pattern comprising optical diffraction elements which are embossed in a carrier material of plastic material and unembossed neutral areas. On the embossing side of the carrier material a reflecting layer covers only surfaces with relief structures of the diffraction elements while the neutral areas which lie between are free of the reflecting layer and are therefore non-reflecting. If the security element is stuck in the form of a stamp onto the substrate and the carrier material is transparent, image portions, which are covered by the stamp, of a feature on the substrate can be discerned through the neutral areas.

Securtiy element

A security element for the authentication of a substrate has a pattern comprising optical diffraction elements which are embossed in a carrier material of plastic material and unembossed neutral areas. On the embossing side of the carrier material a reflecting layer covers only surfaces with relief structures of the diffraction elements while the neutral areas which lie therebetween are free of the reflecting layer and are therefore non-reflecting. If the security element is stuck in the form of a stamp onto the substrate and the carrier metal is transparent, image portions, which are covered by the stamp, of a feature on the substrate can be discerned through the neutral areas.

Security element

A device for measuring a magnetic induction comprises an evaluation device including a source for emitting light and a receiver for receiving light. A resonator is located in the light path between the source and the receiver and comprises first and second parallel mirrors and a gaseous medium occupying the space between the two mirrors. A converter is coupled to one of the mirrors for shifting one of said mirrors along an optical axis of the resonator so that the optical length of the resonator varies in response to the induction to be measured.

Growing community of inventors

Walchwil, Switzerland

Walter Trachslin