General Electric Company

Walter Joseph Bantz

Ui Won Suh

Yuri Alexeyevich Plotnikov

Changting Wang

Richard Eugene Klaassen

William Stewart McKnight

Douglas Edward Ingram

Shyamsunder Tondanur Mandayam

Mottito Togo

An eddy current (EC) probe for inspecting a component is provided. The EC probe includes a tangential drive coil configured to generate a probing field for inducing eddy currents in the component, where a portion of the eddy currents are aligned parallel to an edge of the component. An axis of the tangential drive coil is aligned parallel to a surface of the component. The EC probe further includes a pair of sense coils, where an axis of the sense coils is aligned perpendicular to the surface of the component. The sense coils are configured to sense the portion of the eddy currents aligned parallel to the edge of the component.

Eddy current probe and inspection method

An ultrasonic inspection element and method of fabrication are provided for ultrasonic inspection of curved surface parts. Various points on a transducer are located. These points include the location where a ray starts, to the desired focal point in the material being inspected. The path of the ray is through a water medium and a water-metal boundary. These points are fitted onto a cylindrical surface. The ray is back propagated until it is focused at the desired focal point.

Aspherical curved element transducer to inspect a part with curved entry surface

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West Chester, OH, United States of America

Walter Joseph Bantz