Gould Inc.

Solartron Electronics, Inc.

Gould Inc., Statham Instrument Division

Walter H Eisele

Donald J Koneval

Robert E Lajos

Helmut H Krueger

Peter C Tack

A sensitive deflector beam having an integral deflectable element utilizes an immobilization pin and a limit pin to prevent damage to the deflectable element during fabrication and use. The immobilization pin is inserted through the beam and to the deflectable element to hold the element rigidly in place during fabrication. Thus, relatively rigorous operations such as polishing and circuit deposition may be accomplished without damage to the element.

Strain gage beam having integral overload protection

A thin film strain gage structure (10, 110) for measuring the strain of an inflectible element (12, 112) wherein the gage is formed on a surface (15, 115) of the element and includes a sensing resistance (16, 116) and an adjusting resistance portion (21, 121). Connecting taps are formed in relationship to the resistors to permit adjustment of the adjusting resistor values by suitable connection to selected ones of the taps. The adjusting resistance is preferably disposed adjacent the sensing resistance so as to be subject to similar ambient conditions. The sensing resistance may be provided in the form of a Wheatstone bridge circuit with the adjusting resistors connected in series with two legs of the bridge. Adjustment of the adjusting resistance may be effected selectively by shorting out portions thereof or by suitably connecting to different portions thereof. In one form, the adjustment is effected so as to provide variable ratio between two portions of the resistance connected between legs of the bridge circuit.

Geometric balance adjustment of thin film strain gage sensors

A thin film strain gage structure (10,110) for measuring the strain of an inflectible element (12,112) wherein the gage is formed on a surface (15,115) of the element and includes a sensing resistance (16,116) and an adjusting resistance portion (21,121). Connecting taps are formed in relationship to the resistors to permit adjustment of the adjusting resistor values by suitable connection to selected ones of the taps. The adjusting resistance is preferably disposed adjacent the sensing resistance so as to be subject to similar ambient conditions. The sensing resistance may be provided in the form of a Wheatstone bridge circuit with the adjusting resistors connected in series with two legs of the bridge. Adjustment of the adjusting resistance may be effected selectively by shorting out portions thereof or by suitably connecting to different portions thereof. In one form, the adjustment is effected so as to provide variable ratio between two portions of the resistance connected between legs of the bridge circuit.

A diaphragm consisting of multiple arches configured such that radial compliance is increased and pressure responsive radial compression loading will approximate radial tension loading resulting from deflection of an associated pressure sensor mechanism. On the pressure receiving side of the diaphragm, a broad shallow convex section extends between two concave sections of tighter curvature. The portions of the concave sections remote from the convex section each extend to a substantially cylindrical configuration. A sharp convex bend extending to a flat radial flange provides an attachment edge with minimum attachment stress. A method of forming such a diaphragm to insure uniform wall thickness by allowing maximum lateral migration of the diaphragm sheet is also disclosed.

Diaphragm for pressure sensors

The force transducer includes an essentially symmetrical, beam flexure of generally rectangular platelike construction, one of the edge surfaces being provided with a strain gage. A continuous Z-shaped slotlike passage is formed through the thickness of the beam flexure between its major surface areas, with one cross bar of the 'Z' preferably parallel to the edge carrying the strain gage. An enclosing housing supports the beam flexure via a pair of pin members extending through openings provided in the beam flexure and located at one side of the diagonal portion of the 'Z'. External forces are applied to the beam flexure via a further pin member extending through an opening provided on the other side of the diagonal portion of the 'Z'. Forces to be measured are applied substantially solely in planes parallel to the major surface planes of the beam flexure. An undersized free-floating pin is located within an enlarged bore provided in the center of the diagonal portion of the 'Z' to prevent both operation beyond the most accurate range and damage in the event of exposure to an excessively large force.

Growing community of inventors

Malibu, CA, United States of America

Walter H Eisele