Grumman Aerospace Corporation

Walter G Egan

Theodore W Hilgeman

Robert E Ryan

George P Gayes

Herbert B Hallock

Alignment of antenna radiating elements is monitored by diode lasers which have polarized light reflected from the body of the antenna toward a detector array. The array monitors displacement of polarized radiations from a diode laser corresponding to displacements of the antenna body. Signals from the array to electronically compensate for misalignment or may be utilized in a servo system for mechanically correcting misalignment.

System for compensating antenna membrane deflection

A radiation filter structure having combined wavelength and polarization sensitive characteristics and which is constructed on a single substrate. A plurality of different wavelength (.lambda.1 to .lambda.n) interference filter coatings are applied to different areas of the filter substrate as a plurality of parallel adjacent stripes, such that different wavelengths .lambda.1 to .lambda.n are passed by the different stripe areas. Moreover, a plurality of different polarization filters of both parallel polarization or perpendicular polarization, are also applied as a plurality of parallel adjacent stripes to the different areas of the filter substrate. The arragement includes first and second interference filter stripes for each wavelength .lambda.1 to .lambda.n, and a parallel polarization filter for each first stripe for each wavelength .lambda.1 to .lambda.n, and a perpendicular polarization filter for each second stripe for each wavelength .lambda.1 to .lambda.n, such that parallel and perpendicular polarization components are passed, and can be detected, for each wavelength .lambda.1 to .lambda.n. In different disclosed embodiments the interference filter stripes and the polarization filter stripes are applied to either opposite sides or the same side of the substrate, and can extend along the length or across the width of the substrate. Moreover, the substrate can be formed by a radiation detector array, over which the interference filter stripes and the polarization filter stripes are applied.

Filter structure having combined wavelength and polarization sensitive

A system for detecting and analyzing polarized radiation incident with a skewed polarization plane while utilizing radiation filter structures having combined wavelength and polarization sensitive characteristics. The system includes first and second radiation filters each of which comprises a plurality of different wavelength .lambda.l to .lambda.n interference filter coatings applied to a filter substrate as a plurality of parallel adjacent stripes, such that different wavelengths .lambda.l to .lambda.n are passed by the different stripes. Moreover, a plurality of different polarization filters of either parallel polarization or perpendicular polarization, are also applied as a plurality of parallel adjacent stripes to the different areas of the filter substrate. The arrangement includes first and second interference filter stripes for each wavelength .lambda.l to .lambda.n, a parallel polarization filter for each wavelength .lambda.l to .lambda.n, and a perpendicular polarization filter for each wavelength .lambda.l to .lambda.n, such that parallel and perpendicular polarization components are passed, and can be detected, for each wavelength .lambda.l to .lambda.n. A complete detection and analysis of the polarization characteristics of the radiation is achieved by orienting the first radiation filter with its parallel and perpendicular axes of polarization positioned at a 45.degree. acute angle relative to respectively the parallel and perpendicular axes of polarization of the second filter, such that radiation incident on the first and second radiation filters with a skewed polarization plane can be detected and analyzed with respect to its state of polarization.

Detection system for polarized radiation incident with a skewed

A system for detecting and analyzing polarized radiation having a circular polarization component while utilizing radiation filter structures having combined wavelength and polarization sensitive characteristics. The system includes a radiation filter which comprises a plurality of different wavelength .lambda.1 to .lambda.n interference filter coatings applied to a filter substrate as a plurality of parallel adjacent stripes, such that different wavelengths .lambda.1 to .lambda.n are passed by the different stripes. Moreover, a plurality of different polarization filters of either parallel polarization or perpendicular polarization, are also applied as a plurality of parallel adjacent stripes to the different areas of the filter substrate. The arrangement includes first, second, third and fourth interference filter stripes for each wavelength .lambda.1 to .lambda.n, two parallel polarization filters for each wavelength .lambda.1 to .lambda.n, and two perpendicular polarization filters for each wavelength .lambda.1 to .lambda.n. A complete detection and analysis of the polarization characteristics of the circularly polarized radiation is achieved by applying a quarter wave plate to each polarization component (both parallel and perpendicular) of each wavelength .lambda.n to provide two measurements, one with and one without the quarter wave plate for each measurement (both parallel and perpendicular) at each wavelength .lambda.n.

Detection system for circularly polarized radiation

An instrument for measuring the retroreflectance properties of surfaces to angles including an angle of zero degrees of the incident beam. The instrument comprises a source of collimated radiation, a beam splitter such as a cube biprism, a beam chopper, a radiation sensor system operated in a coherent detection mode with the chopper, and indicating and/or recording means. A beam of radiation aimed at a normal incidence at the surface of the test specimen is passed through the biprism which has its 45.degree. diagonal semi-reflecting surface interposed in the beam. The undesirable part of the beam is reflected off the diagonal surface to and through one of the sides of the biprism and the reflection back therefrom passes through the diagonal surface and then travels to the radiation sensor. The desirable part of the beam from the radiation source goes directly through the diagonal surface and passes to the surface of the specimen. Radiation incident on the specimen surface is reflected back to the biprism whence it is partially reflected off the diagonal surface and it too passes to the sensor. The chopper is interposed in the radiation path between the biprism and the specimen and periodically interrupts the radiation therebetween. The sensor is operated in a coherent-detection background-discrimination mode with the chopper such that a signal indicating the retroreflectance properties of the specimen surface is obtained.

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Woodhaven, NY, United States of America

Walter G Egan