Koninklijke Philips Corporation N.v.

Wai Lik William Wong

Mohankumar Valiyambath Krishnan

Linfang Xu

Zhen Ming Jimmy Xing

The invention relates to a fabric sensor () for determining a fabric type. The fabric sensor () comprises a first structural component () comprising a first sensing surface (), and a second structural component () comprising a second sensing surface (). The first structural component () and the second structural component () are movable relative to each other to form a closed arrangement wherein the first sensing surface () and the second sensing surface () hold the fabric. The fabric sensor () also comprises a thickness measurement mechanism () for measuring a thickness of the fabric when the fabric is held between the first sensing surface () and the second sensing surface (). The fabric sensor () also comprises a processing unit () coupled to the thickness measurement mechanism () and at least one of the first sensing surface () and the second sensing surface (). At least one of the first sensing surface () and the second sensing surface () is adapted to sense a characteristic of the fabric. The processing unit () is configured to determine the fabric type based on the thickness of the fabric and the characteristic of the fabric.

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Eindhoven, Netherlands

Wai Lik William Wong