Ltx Corporation

Xcerra Corporation

Wai-Kong Chen

Michael Carlyle Davis

Warren Necoechea

David Harris

Tim Alton

An automated test platform for testing a first device under test includes N voltage sources for providing N different voltages. A cross matrix switching system is coupled to the N voltage sources, the cross matrix switch being configured to provide the N different voltages to M discrete test points within the first device under test, wherein M is larger than N. An N voltage measuring system is coupled to the first device under test, the N voltage measuring system being configured to measure the voltage potential present on the M discrete test points.

Automated test platform for testing short circuits

A phase-locked loop circuit having a programmable tuning voltage. As the input reference clock frequency is changed, the tuning voltage is changed accordingly to compensate for the propagation delay through the phase detector and thereby reduce discrepancies in the phase relationship between the input reference clock signal and the output clock signal at different frequencies. A set of compensation values corresponding to input reference clock frequencies are stored in a memory device. When the input reference clock frequency is changed, a corresponding compensation value is programmed to a digital-to-analog converter (DAC). The DAC outputs a voltage that is proportional to the value of the digital input to the DAC and can thus be used to regulate the tuning voltage of the PLL circuit so that the relationship of the input reference clock signal to the output clock signal remains stable with frequency changes.

Growing community of inventors

Fremont, CA, United States of America

Wai-Kong Chen