Asm Technology Singapore Pte Ltd

Asm Assembly Automation Limited

Wai Hong Sizto

Pei Wei Tsai

Wai Chuen Gan

Chak Tong Albert Sze

Chak Tong Sze

Sai Kit Wong

Shing Wai Tam

Chunbai Wang

A device sorting apparatusis disclosed herein. In a described embodiment, the device sorting apparatuscomprises a plurality of bin connectorsfor coupling to respective bins for storing sorted devices and a rotary distribution modulefor receiving a deviceto be sorted and for discharging the deviceselectively into one of the bin connectorsto enable the deviceto be unloaded to the respective bin. The device sorting apparatusfurther comprises a sensorcoupled to the rotary distribution modulefor detecting the discharge of the device, and which is rotatable together with the rotary distribution module; and a rotary transformerfor powering the sensor

Device sorting apparatus

A test handler is provided for testing electronic devices having light-emitting elements. Electronic devices are mounted at a loading position, optical measurements are conducted at a test contact position where a testing device is located for optical communication with the light-emitting elements and then tested electronic devices are removed at an unloading position. Multiple test contactors hold the electronic devices and move them to and through the loading position, test contact position and unloading position in sequence. Each test contactor comprises a device contact point including electrical conductors which are connected to electrical contacts of the electronic device when the electronic device is mounted at the device contact point, and a retaining mechanism grips the electronic device at the device contact point such that the retaining mechanism does not obstruct the optical communication between the testing device and the light-emitting element at the test contact position.

Test handler including gripper-type test contactor

Growing community of inventors

Hong Kong, China

Wai Hong Sizto