Newport Corporation

Wade P Watts

John C Curry

Christopher Cole Chandler

Nicholas Donnie Harriott

A method of characterizing the performance of laser diode is disclosed wherein at least one laser diode device configured to emit optical radiation is detachably coupled to at least one carrier device, the carrier device configured to be positioned within at least one device test module, at least one unitary clamping force is controllably applied to the laser diode device thereby coupling the carrier device to the device test module, and at least one optical characteristic of the laser diode device is measured during use.

High power laser diode test system and method of manufacture

A high power laser diode test system is disclosed which includes a housing body defining at least one device test module compartment therein, a power supply, the system controller, and thermal control system positioned within the device test module compartment, a device test module having at least one carrier device receiver formed therein detachably coupled to the housing body, and at least one carrier device configured to support at least one laser diode device coupled thereto detachably positioned within the carrier device port formed on the device test module.

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Wheat Ridge, CO, United States of America

Wade P Watts