Byk-Chemie Gmbh

Volker Thyssen-Wallner

Petra Della Valentina

Manfred Knospe

Brigitte Dicke

Jörg Hinnerwisch

Christopher Groh

Nikolay Kladt

The invention relates to a method for providing a system for assessing a coated surface with respect to a type set containing at least one type of surface defect that can occur on the surface, to such a system for assessing a coated surface, to a measuring device for acquiring an image of a coated surface including such a system, and to a method for assessing a coated surface using such a system. The system can use a convolutional neural network (CNN), in particular the so-called U-Net architecture, to recognize the at least one surface defect in an image provided to the system. Moreover, the system can use a support vector machine algorithm to provide, based on the recognition results, quantitative and/or qualitative information about the depiction of the at least one surface defect in the image provided to the system.

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Goch, Germany

Volker Thyssen-Wallner