Leica Microsystems Cms Gmbh

Volker Leimbach

Heinrich Ulrich

Juergen Riedmann

Holger Birk

Ingo Boehm

Reiner Rygiel

Manuel Dr Kremer

A device for examining and manipulating microscopic objects with a microscope having a light source that serves to illuminate the object, and which generates an illumination light beam that runs along and illumination beam path, that can be guided over or through the object by means of a beam deflector, with a detector to detect light emitted from the object that runs along the detection beam path, with a primary beam splitter, and with a light source, which generates a manipulation light beam that runs along an illumination beam path, that serves to manipulate the object.

Device for examining and manipulating microscopic objects with coupled illumination and manipulation light beams

The invention relates to a microscope comprising at least one first and second light sources, a first light-guiding fiber connected to the first light source and a second light-guiding fiber connected to the second light source, wherein the light emitted by corresponding light source is injectable into the connected light-guiding fiber. The inventive microscope also comprises an objective lens disposed in the illumination beam path and is characterized in that a fiber multiplexer connected to the first and second light-guiding fibers, receiving the light from the light source and selectively allowing the light from the first or second light source to pass is disposed in the illumination beam path.

Microscope

An optical arrangement includes a laser, and a chromatic error correcting device arranged in a beam path of the laser. The chromatic error correcting device includes a pulse stretcher.

Optical arrangement

A 4Pi microscope provided with an interferometer wherein two lenses () are arranged in such a way that they are opposite to each other on different sides of a sample plane (); also comprising an optical element () which is used to inject illuminating light () into the interferometer and/or used to discharge detection light () from the interferometer and to deflect a detection beam path, containing a reflecting means () which reflects illuminating light discharged by the optical element back into the interferometer and/or which allows detection light which is deflected onto the deflection beam to pass, also reflecting other discharged detection light which is not deflected onto the detection beam path into the interferometer.

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Ludwigshafen, Germany

Volker Leimbach