Carl Zeiss Jena Gmbh

Carl Zeiss Microimaging Gmbh

Volker Gerstner

Ralf Wolleschensky

Gunter Moehler

Thomas Mehner

Jörg Steinert

Frank Hecht

Ralph Lange

Helmut Bloos

Joerg Lindenau

Jörg Lindenau

A diaphragm device with which individual wavelengths or ranges of wavelengths in the path of a beam of spectrally dispersed light can be suppressed. Such a diaphragm device comprises at least one array of diaphragms, wherein the individual diaphragms of the array are arranged in a definite relation to each other and may be coupled in the path of the beam and each diaphragm of the array in the coupled state is arranged in a given relation to an individual wavelength or a range of wavelengths.

Diaphragm device

A method and/or arrangement for the analysis of fluorescing samples in an image-generating microscope system, preferably a laser scanning microscope, wherein the sample is scanned point-by-point or line-by-line in at least one surface section and a dispersive splitting of the radiation coming from the sample is carried out during the scanning, wherein the split radiation is detected by at least one line of detector elements in a wavelength-dependent manner, a selection of two-dimensional or three-dimensional sample parts which correspond to pre-stored two-dimensional or three-dimensional geometric objects or the like is carried out based on the recorded and stored intensity distribution of at least one of these detection elements and/or at least one other detection element for the radiation reflected from the sample by image processing, and an analysis of the spectral signature and/or spatial spectral sequence is carried out for at least a portion of these sample regions with respect to the fluorescence markers arranged thereon.

Method and arrangement for analyzing samples

A method of optical detection of characteristic quantities of an illuminated specimen comprising detecting a signal that is backscattered, reflected and/or fluoresced and/or transmitted from the specimen by a spatially resolving detector wherein radiation coming from the specimen is imaged on the detector, shifting the position of the radiation which is measured in a spatially resolved manner relative to the detector and determining intermediate values by an algorithm from the signals measured in different shifts for purposes of increasing the spatial resolution of the detector. An arrangement for performing the method is also disclosed.

Method for increasing the spectral and spatial resolution of detectors

A method and arrangement are disclosed for increasing the depth contrast in microscope imaging. The method and implementation described can be designated as structured illumination for generating quasi-confocal optical sections. In implementing the method, a grating structure located in the field diaphragm plane of a microscope, the object plane and the TV intermediate image plane of a microscope are arranged confocally. The term &ldquo;confocally&rdquo; refers to the fact that the grating, object and the intermediate image plane are positioned on optically conjugate planes. By this arrangement, the grating structure is projected in the object plane of the microscope and the object which is structured in this way is imaged in the TV intermediate image plane of the microscope by the optical system following it. Optical sections are generated by calculating the modulation depth of the structured object. Three-dimensional acquisition of the object is achieved in that the object is imaged in a plurality of focus planes at right angles to the direction of observation and is detected using an array detector (e.g., CCD camera). The method and implementation of structured illumination described herein can primarily be used in reflection microscopy and fluorescence microscopy. In principle, the method can be applied for all linear interactions between light and matter. The use of the method is likewise not limited to the field of microscopy.

Assembly for increasing the depth discrimination of an optical imaging system

Process for detecting the phenomenon of fluorescence in a microscope, wherein the sample is irradiated by a modulated and/or pulsed laser light source, and the fluorescence is detected at least in two different phase positions of the detector.

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Jena, Germany

Volker Gerstner