International Business Machines Corporation

Vladmimir Zolotov

Chandramouli Visweswariah

Eric A Foreman

Peter Anton Habitz

Jeffrey G Hemmett

Natesan Venkateswaran

Nathan C Buck

John P Dubuque

Brian M Dreibelbis

Xiaoyue X Wang

Solutions for integrating manufacturing feedback into an integrated circuit design are disclosed. In one embodiment, a computer-implemented method is disclosed including: defining an acceptable yield requirement for a first integrated circuit product; obtaining manufacturing data about the first integrated circuit product; performing a regression analysis on data representing paths in the first integrated circuit product to define a plurality of parameter settings based upon the acceptable yield requirement and the manufacturing data; determining a projection corner associated with the parameter settings for satisfying the acceptable yield requirement; and modifying a design of a second integrated circuit product based upon the projection corner and the plurality of parameter settings.

Integrating manufacturing feedback into integrated circuit structure design

Growing community of inventors

Putnam Valley, NY, United States of America

Vladmimir Zolotov