Freescale Semiconductor,inc.

Vladimir Vorisek

Markus Regner

Heiko Ahrens

IC device comprising a plurality of functional components arranged into self-test cells. The IC device is configurable into a first self-test configuration comprising a first set of self-test partitions. Each self-test partition within the first set comprising at least one self-test cell. Functional components of the self-test cell(s) of each self-test partition within the first set are arranged to be configured into at least one scan-chain for said self-test partition when the IC device is configured into the first self-test configuration. The IC device is configurable into a second self-test configuration comprising a second set of self-test partitions. Each self-test partition within the second set comprising at least one self-test cell. Functional components of the self-test cell(s) of each self-test partition within the second set are arranged to be configured into at least one scan-chain for said self-test partition when the IC device is configured into the second self-test configuration.

Integrated circuit device and method of performing self-testing within an integrated circuit device

An integrated circuit (IC) device, and method therefor, the IC device comprising a plurality of self-test components arranged to execute self-tests in parallel during a self-test execution phase of the IC device, and at least one clock control component arranged to provide at least one clock signal to the plurality of self-test components at least during the self-test execution phase of the IC device. The at least one clock control component is further arranged to receive at least one indication that self-testing has ceased within at least a first self-test component, and dynamically modulate the at least one clock signal provided to at least one further self-test component for which self-testing has not ceased to increase a clock rate of the at least one clock signal upon receipt of an indication that self-test execution has ceased within the at least first self-test component.

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Forstinning, Germany

Vladimir Vorisek